Inventor
TERAO KENJI
JP23 patents
⚠️ This page may combine multiple inventors who share the name “TERAO KENJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
EBARA CORP
10 patentsUS7256405B2Aug 14, 2007
Sample repairing apparatus, a sample repairing method and a device manufacturing method using the same method
EBARA CORP21 citations92
US6663710B1Dec 16, 2003
Method for continuously pulling up crystal
EBARA CORP13 citations79
US9966227B2May 8, 2018
Specimen observation method and device using secondary emission electron and mirror electron detection
EBARA CORP5 citations73
US7952071B2May 31, 2011
Apparatus and method for inspecting sample surface
EBARA CORP3 citations63
US7829853B2Nov 9, 2010
Sample surface observation method
EBARA CORP3 citations63
US6471768B2Oct 29, 2002
Method of and apparatus for growing ribbon of crystal
EBARA CORP3 citations59
US10002740B2Jun 19, 2018
Inspection device
EBARA CORP0 citations52
US9852878B2Dec 26, 2017
Surface processing apparatus
EBARA CORP0 citations52
US9105444B2Aug 11, 2015
Electro-optical inspection apparatus and method with dust or particle collection function
EBARA CORP0 citations51
US10446404B2Oct 15, 2019
Electron-beam irradiated area adjustment method and adjustment system, electron-beam irradiated region correction method, and electron beam irradiation apparatus
EBARA CORP0 citations41
NEC CORP
4 patentsUS7496163B2Feb 24, 2009
AGC system, AGC method, and receiver using the AGC system
NEC CORP13 citations83
US7039097B2May 2, 2006
CDMA receiver, path search method and program
NEC CORP8 citations73
US7366263B2Apr 29, 2008
Radio communication terminal and radio signal receiving method
NEC CORP3 citations62
US7254162B2Aug 7, 2007
CDMA receiver performing a path search, path search method, and program therefor
NEC CORP4 citations62