Inventor
YONAGA TAKERU
JP8 patents
Patents
8 patentsUS7114113B2Sep 26, 2006
Test circuit provided with built-in self test function
OKI ELECTRIC IND CO LTD38 citations92
US5444662AAug 22, 1995
Dynamic random access memory with bit line equalizing means
OKI ELECTRIC IND CO LTD41 citations89
US7225379B2May 29, 2007
Circuit and method for testing semiconductor device
OKI ELECTRIC IND CO LTD12 citations82
US5420823AMay 30, 1995
Semiconductor memory with improved power supply control circuit
OKI ELECTRIC IND CO LTD19 citations77
US7437645B2Oct 14, 2008
Test circuit for semiconductor device
OKI ELECTRIC IND CO LTD6 citations73
US7249295B2Jul 24, 2007
Test circuit for semiconductor device
OKI ELECTRIC IND CO LTD9 citations73
US7333372B2Feb 19, 2008
Reset circuit and integrated circuit device with reset function
OKI ELECTRIC IND CO LTD5 citations62
US5790470AAug 4, 1998
Decoder circuit having a predecoder acitivated by a reset signal
OKI ELECTRIC IND CO LTD3 citations61