Inventor

KURITA KAZUNARI

JP31 patents

⚠️ This page may combine multiple inventors who share the name “KURITA KAZUNARI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KURITA KAZUNARI

SUMCO CORP

Silicon substrate and manufacturing method thereof

Method of producing epitaxial silicon wafer, epitaxial silicon wafer, and method of producing solid-state imaging device

Method for producing semiconductor epitaxial wafer and method of producing solid-state imaging device

Method and apparatus for manufacturing semiconductor substrate dedicated to semiconductor device, and method and apparatus for manufacturing semiconductor device

Method of detecting heavy metal in semiconductor substrate

Silicon wafer and method for producing same

Method for producing silicon wafer

Method of producing semiconductor epitaxial wafer and method of producing solid-state image sensor

Epitaxial wafer manufacturing method and epitaxial wafer

High frequency diode and method for producing same

High frequency diode and method for producing same

Silicon wafer and method for producing same

Method of evaluating impurity gettering capability of epitaxial silicon wafer and epitaxial silicon wafer

Method of producing semiconductor epitaxial wafer, semiconductor epitaxial wafer, and method of producing solid-state image sensing device

Process for producing high-resistance silicon wafers and process for producing epitaxial wafers and SOI wafers

Method for producing wafer for backside illumination type solid imaging device

Thin silicon wafer and method of manufacturing the same

Epitaxial wafer manufacturing method and epitaxial wafer

Epitaxial wafer manufacturing method and epitaxial wafer

KURITA KAZUNARI

Semiconductor substrate for solid-state image sensing device as well as solid-state image sensing device and method for producing the same

High resistivity silicon wafer and method for manufacturing the same

Silicon substrate and manufacturing method thereof

Epitaxial substrate for solid-state imaging device with gettering sink, semiconductor device, back illuminated solid-state imaging device and manufacturing method thereof

Semiconductor substrate for solid-state imaging sensing device as well as solid-state image sensing device and method for producing the same

Method of producing epitaxial substrate with gettering for solid-state imaging device, and method of producing solid-state imaging device using same substrate

Method of producing semiconductor wafer

Silicon substrate and manufacturing method of the same

Method of producing silicon wafer, epitaxial wafer and solid state image sensor, and device for producing silicon wafer

SUMITOMO MITSUBISHI SILICON

Method for measuring point defect distribution of silicon single crystal ingot

Method of identifying defect distribution in silicon single crystal ingot

KADONO TAKESHI

Method of producing semiconductor epitaxial wafer, semiconductor epitaxial wafer, and method of producing solid-state image sensing device