Inventor
ARIYOSHI SHUNSUKE
JP15 patents
⚠️ This page may combine multiple inventors who share the name “ARIYOSHI SHUNSUKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ARIYOSHI SHUNSUKE
7 patentsUS9074971B2Jul 7, 2015
Sample processing apparatus and non-transitory storage medium
ARIYOSHI SHUNSUKE5 citations71
US8209196B2Jun 26, 2012
Specimen testing apparatus, test information management apparatus, and test information output method
ARIYOSHI SHUNSUKE2 citations61
US8996317B2Mar 31, 2015
Sample analyzer, computer program product for a sample analyzer and method for analyzing a sample
ARIYOSHI SHUNSUKE3 citations60
US8180573B2May 15, 2012
Sample processing apparatus, method of outputting processing result by sample processing apparatus, and computer program product
ARIYOSHI SHUNSUKE2 citations60
US8504301B2Aug 6, 2013
Sample analyzer, method for displaying analysis result information of a sample and computer program product
ARIYOSHI SHUNSUKE1 citations51
US8700339B2Apr 15, 2014
Sample processing apparatus, method of outputting processing result by sample processing apparatus, and computer program product
ARIYOSHI SHUNSUKE0 citations50
US9317658B2Apr 19, 2016
Data management computer, sample analyzing system, and computer program
ARIYOSHI SHUNSUKE0 citations31
SYSMEX CORP
5 patentsUS9618363B2Apr 11, 2017
Specimen analysis system, specimen analyzer, and specimen analysis method
SYSMEX CORP2 citations72
USRE49503EApr 25, 2023
Sample processing apparatus
SYSMEX CORP0 citations61
USRE48189ESep 1, 2020
Sample processing apparatus
SYSMEX CORP0 citations51
US9500662B2Nov 22, 2016
Sample analyzer and sample analyzing method
SYSMEX CORP1 citations50
US11754580B2Sep 12, 2023
Sample measurement method and sample measurement device
SYSMEX CORP0 citations49