Inventor
PERELMAN GERSHON
US24 patents
⚠️ This page may combine multiple inventors who share the name “PERELMAN GERSHON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AGILENT TECHNOLOGIES INC
10 patentsUS9053915B2Jun 9, 2015
Radio frequency (RF) ion guide for improved performance in mass spectrometers at high pressure
AGILENT TECHNOLOGIES INC10 citations82
US10145753B2Dec 4, 2018
Apparatus and method for dynamically balancing rotors
AGILENT TECHNOLOGIES INC18 citations79
US10010884B1Jul 3, 2018
Droplet actuation enhancement using oscillatory sliding motion between substrates in microfluidic devices
AGILENT TECHNOLOGIES INC6 citations73
US9589775B2Mar 7, 2017
Plasma cleaning for mass spectrometers
AGILENT TECHNOLOGIES INC5 citations71
US9153427B2Oct 6, 2015
Vacuum ultraviolet photon source, ionization apparatus, and related methods
AGILENT TECHNOLOGIES INC4 citations71
US9449805B2Sep 20, 2016
Isolation of charged particle optics from vacuum chamber deformations
AGILENT TECHNOLOGIES INC2 citations63
US12548750B2Feb 10, 2026
Axially progressive lens for transporting charged particles
AGILENT TECHNOLOGIES INC0 citations62
US12119214B2Oct 15, 2024
Ion guide with varying multipoles
AGILENT TECHNOLOGIES INC0 citations62
US11791149B2Oct 17, 2023
Axially progressive lens for transporting charged particles
AGILENT TECHNOLOGIES INC0 citations62
US11515137B2Nov 29, 2022
Ion guide with varying multipoles
AGILENT TECHNOLOGIES INC1 citations62
KLA TENCOR CORP
6 patentsUS6816249B2Nov 9, 2004
High throughput brightfield/darkfield wafer inspection system using advanced optical techniques
KLA TENCOR CORP49 citations96
US5970168AOct 19, 1999
Fourier filtering mechanism for inspecting wafers
KLA TENCOR CORP78 citations94
US7554655B2Jun 30, 2009
High throughput brightfield/darkfield water inspection system using advanced optical techniques
KLA TENCOR CORP16 citations92
US7379173B2May 27, 2008
High throughput brightfield/darkfield wafer inspection system using advanced optical techniques
KLA TENCOR CORP9 citations84
US7522275B2Apr 21, 2009
High throughput darkfield/brightfield wafer inspection system using advanced optical techniques
KLA TENCOR CORP1 citations63
US7259844B2Aug 21, 2007
High throughput darkfield/brightfield wafer inspection system using advanced optical techniques
KLA TENCOR CORP2 citations63
KLA TENCOR TECH CORP
2 patentsUS6288780B1Sep 11, 2001
High throughput brightfield/darkfield wafer inspection system using advanced optical techniques
KLA TENCOR TECH CORP207 citations99
US7164475B2Jan 16, 2007
High throughput brightfield/darkfield wafer inspection system using advanced optical techniques
KLA TENCOR TECH CORP17 citations92