Inventor

CHEN CHUN-HSING

TW4 patents

⚠️ This page may combine multiple inventors who share the name “CHEN CHUN-HSING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

2 patents

US11994534B2May 28, 2024

Testing device for integrated circuit package

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations55

US11604211B1Mar 14, 2023

Testing device and method for integrated circuit package

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations55

TAIWAN SEMICONDUCTOR MFG

1 patent

US7750651B2Jul 6, 2010

Wafer level test probe card

TAIWAN SEMICONDUCTOR MFG18 citations88

CHAO CLINTON CHIH-CHIEH

1 patent

US8146245B2Apr 3, 2012

Method for assembling a wafer level test probe card

CHAO CLINTON CHIH-CHIEH4 citations53