Inventor
GAMBINO JEFFREY P
US482 patents
⚠️ This page may combine multiple inventors who share the name “GAMBINO JEFFREY P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
46 patentsUS6720213B1Apr 13, 2004
Low-K gate spacers by fluorine implantation
IBM277 citations99
US6689650B2Feb 10, 2004
Fin field effect transistor with self-aligned gate
IBM216 citations99
US6590259B2Jul 8, 2003
Semiconductor device of an embedded DRAM on SOI substrate
IBM177 citations99
US6350653B1Feb 26, 2002
Embedded DRAM on silicon-on-insulator substrate
IBM236 citations99
US9455187B1Sep 27, 2016
Backside device contact
IBM40 citations98
US8053814B2Nov 8, 2011
On-chip embedded thermal antenna for chip cooling
IBM44 citations98
US7781781B2Aug 24, 2010
CMOS imager array with recessed dielectric
IBM65 citations98
US7622364B2Nov 24, 2009
Bond pad for wafer and package for CMOS imager
IBM61 citations98
US7323780B2Jan 29, 2008
Electrical interconnection structure formation
IBM62 citations98
US7193289B2Mar 20, 2007
Damascene copper wiring image sensor
IBM89 citations98
US6501131B1Dec 31, 2002
Transistors having independently adjustable parameters
IBM95 citations98
US6060746AMay 9, 2000
Power transistor having vertical FETs and method for making same
IBM90 citations98
US6025226AFeb 15, 2000
Method of forming a capacitor and a capacitor formed using the method
IBM107 citations98
US7759755B2Jul 20, 2010
Anti-reflection structures for CMOS image sensors
IBM45 citations96
US7405147B2Jul 29, 2008
Device and methodology for reducing effective dielectric constant in semiconductor devices
IBM35 citations96
US6166423ADec 26, 2000
Integrated circuit having a via and a capacitor
IBM59 citations96
US6150212ANov 21, 2000
Shallow trench isolation method utilizing combination of spacer and fill
IBM75 citations96
US6081021AJun 27, 2000
Conductor-insulator-conductor structure
IBM76 citations96
US5915183AJun 22, 1999
Raised source/drain using recess etch of polysilicon
IBM69 citations96
US5879985AMar 9, 1999
Crown capacitor using a tapered etch of a damascene lower electrode
IBM71 citations96
US5792703AAug 11, 1998
Self-aligned contact wiring process for SI devices
IBM92 citations96
US5573633ANov 12, 1996
Method of chemically mechanically polishing an electronic component
IBM56 citations96
US5383088AJan 17, 1995
Storage capacitor with a conducting oxide electrode for metal-oxide dielectrics
IBM72 citations96
US5298784AMar 29, 1994
Electrically programmable antifuse using metal penetration of a junction
IBM87 citations96
US7335577B2Feb 26, 2008
Crack stop for low K dielectrics
IBM47 citations95
US7129545B2Oct 31, 2006
Charge modulation network for multiple power domains for silicon-on-insulator technology
IBM46 citations95
US5266504ANov 30, 1993
Low temperature emitter process for high performance bipolar devices
IBM53 citations95
US8871549B2Oct 28, 2014
Biological and chemical sensors
IBM33 citations94
US9911708B2Mar 6, 2018
Conductive pillar shaped for solder confinement
IBM9 citations93
US9627575B2Apr 18, 2017
Photodiode structures
IBM9 citations93
US9514987B1Dec 6, 2016
Backside contact to final substrate
IBM18 citations93
US8847401B2Sep 30, 2014
Semiconductor structure incorporating a contact sidewall spacer with a self-aligned airgap and a method of forming the semiconductor structure
IBM22 citations93
US8021950B1Sep 20, 2011
Semiconductor wafer processing method that allows device regions to be selectively annealed following back end of the line (BEOL) metal wiring layer formation
IBM20 citations93
US8017997B2Sep 13, 2011
Vertical metal-insulator-metal (MIM) capacitor using gate stack, gate spacer and contact via
IBM21 citations93
US8003425B2Aug 23, 2011
Methods for forming anti-reflection structures for CMOS image sensors
IBM20 citations93
US7943428B2May 17, 2011
Bonded semiconductor substrate including a cooling mechanism
IBM33 citations93
US7892940B2Feb 22, 2011
Device and methodology for reducing effective dielectric constant in semiconductor devices
IBM11 citations93
US7825511B2Nov 2, 2010
Undercut-free BLM process for Pb-free and Pb-reduced C4
IBM37 citations93
US7772028B2Aug 10, 2010
CMOS imager with Cu wiring and method of eliminating high reflectivity interfaces therefrom
IBM27 citations93
US7670921B2Mar 2, 2010
Structure and method for self aligned vertical plate capacitor
IBM31 citations93
US7671442B2Mar 2, 2010
Air-gap insulated interconnections
IBM19 citations93
US7662722B2Feb 16, 2010
Air gap under on-chip passive device
IBM31 citations93
US7652313B2Jan 26, 2010
Deep trench contact and isolation of buried photodetectors
IBM22 citations93
US7537951B2May 26, 2009
Image sensor including spatially different active and dark pixel interconnect patterns
IBM21 citations93
US7521798B2Apr 21, 2009
Stacked imager package
IBM13 citations93
US7485564B2Feb 3, 2009
Undercut-free BLM process for Pb-free and Pb-reduced C4
IBM20 citations93
DAUBENSPECK TIMOTHY H
2 patentsUS8742594B2Jun 3, 2014
Structure and method of making an offset-trench crackstop that forms an air gap adjacent to a passivated metal crackstop
DAUBENSPECK TIMOTHY H30 citations93
US8508043B2Aug 13, 2013
Metal pad structure for thickness enhancement of polymer used in electrical interconnection of semiconductor die to semiconductor chip package substrate with solder bump
DAUBENSPECK TIMOTHY H24 citations93
CORNELL RES FOUNDATION INC
1 patentGLOBALFOUNDRIES INC
1 patentShowing the top 50 of 482 patents by PatentIndex Score.