P

Inventor

RODBELL KENNETH P

US115 patents
⚠️ This page may combine multiple inventors who share the name “RODBELL KENNETH P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

45 patents
US6685548B2Feb 3, 2004

Grooved polishing pads and methods of use

IBM137 citations99
US7649257B2Jan 19, 2010

Discrete placement of radiation sources on integrated circuit devices

IBM62 citations98
US4954142ASep 4, 1990

Method of chemical-mechanical polishing an electronic component substrate and polishing slurry therefor

IBM330 citations98
US6656019B1Dec 2, 2003

Grooved polishing pads and methods of use

IBM63 citations96
US6383066B1May 7, 2002

Multilayered polishing pad, method for fabricating, and use thereof

IBM91 citations96
US6344129B1Feb 5, 2002

Method for plating copper conductors and devices formed

IBM46 citations96
US5565707AOct 15, 1996

Interconnect structure using a Al2 Cu for an integrated circuit chip

IBM54 citations96
US5071714ADec 10, 1991

Multilayered intermetallic connection for semiconductor devices

IBM104 citations96
US9881880B2Jan 30, 2018

Tamper-proof electronic packages with stressed glass component substrate(s)

IBM15 citations93
US9431354B2Aug 30, 2016

Activating reactions in integrated circuits through electrical discharge

IBM12 citations93
US8816717B2Aug 26, 2014

Reactive material for integrated circuit tamper detection and response

IBM26 citations93
US7491643B2Feb 17, 2009

Method and structure for reducing contact resistance between silicide contact and overlying metallization

IBM16 citations93
US7491948B2Feb 17, 2009

Method of detecting and transmitting radiation detection information to a network

IBM41 citations93
US7381635B2Jun 3, 2008

Method and structure for reduction of soft error rates in integrated circuits

IBM17 citations93
US7843063B2Nov 30, 2010

Microstructure modification in copper interconnect structure

IBM29 citations92
US6974531B2Dec 13, 2005

Method for electroplating on resistive substrates

IBM20 citations92
US6333120B1Dec 25, 2001

Method for controlling the texture and microstructure of plated copper and plated structure

IBM49 citations92
US5943601AAug 24, 1999

Process for fabricating a metallization structure

IBM27 citations92
US5912506AJun 15, 1999

Multi-layer metal sandwich with taper and reduced etch bias and method for forming same

IBM42 citations92
US5171642ADec 15, 1992

Multilayered intermetallic connection for semiconductor devices

IBM33 citations92
US6712681B1Mar 30, 2004

Polishing pads with polymer filled fibrous web, and methods for fabricating and using same

IBM26 citations91
US6452276B1Sep 17, 2002

Ultra thin, single phase, diffusion barrier for metal conductors

IBM38 citations91
US6340325B1Jan 22, 2002

Polishing pad grooving method and apparatus

IBM31 citations91
US6037795AMar 14, 2000

Multiple device test layout

IBM29 citations89
US10177102B2Jan 8, 2019

Tamper-proof electronic packages with stressed glass component substrate(s)

IBM4 citations84
US9913370B2Mar 6, 2018

Tamper-proof electronic packages formed with stressed glass

IBM14 citations84
US9735077B1Aug 15, 2017

Heterogeneous miniaturization platform

IBM5 citations84
US9586857B2Mar 7, 2017

Controlling fragmentation of chemically strengthened glass

IBM13 citations84
US8861728B2Oct 14, 2014

Integrated circuit tamper detection and response

IBM12 citations84
US8860176B2Oct 14, 2014

Multi-doped silicon antifuse device for integrated circuit

IBM6 citations84
US8828870B2Sep 9, 2014

Microstructure modification in copper interconnect structures

IBM8 citations84
US8361829B1Jan 29, 2013

On-chip radiation dosimeter

IBM8 citations84
US7923838B2Apr 12, 2011

Method and structure for reducing contact resistance between silicide contact and overlying metallization

IBM12 citations84
US8008199B2Aug 30, 2011

Microstructure modification in copper interconnect structure

IBM8 citations83
US6946716B2Sep 20, 2005

Electroplated interconnection structures on integrated circuit chips

IBM16 citations82
US7517795B2Apr 14, 2009

Stabilization of Ni monosilicide thin films in CMOS devices using implantation of ions before silicidation

IBM9 citations81
US7119012B2Oct 10, 2006

Stabilization of Ni monosilicide thin films in CMOS devices using implantation of ions before silicidation

IBM14 citations81
US6989117B2Jan 24, 2006

Polishing pads with polymer filled fibrous web, and methods for fabricating and using same

IBM15 citations80
US6986078B2Jan 10, 2006

Optimization of storage and power consumption with soft error predictor-corrector

IBM16 citations79
US6200894B1Mar 13, 2001

Method for enhancing aluminum interconnect properties

IBM7 citations74
US10535713B2Jan 14, 2020

Integrated reactive material erasure element with phase change memory

IBM2 citations73
US10380284B2Aug 13, 2019

Heterogeneous miniaturization platform

IBM2 citations73
US10257924B2Apr 9, 2019

Tamper-proof electronic packages formed with stressed glass

IBM3 citations73
US10170361B2Jan 1, 2019

Thin film interconnects with large grains

IBM4 citations73
US9941004B2Apr 10, 2018

Integrated arming switch and arming switch activation layer for secure memory

IBM2 citations73

CABRAL JR CYRIL

3 patents

INFINEON TECHNOLOGIES AG

1 patent

FAROOQ MUKTA G

1 patent

Showing the top 50 of 115 patents by PatentIndex Score.