Inventor
WILLIAMSON EDDIE
US4 patents
Patents
4 patentsUS7057395B1Jun 6, 2006
Method for diagnosing open defects on non-contacted nodes of an electronic device from measurements of capacitively coupled nodes
AGILENT TECHNOLOGIES INC23 citations88
US7075307B1Jul 11, 2006
Method and apparatus for detecting shorts on inaccessible pins using capacitive measurements
AGILENT TECHNOLOGIES INC16 citations79
US7242198B2Jul 10, 2007
Method for using internal semiconductor junctions to aid in non-contact testing
AGILENT TECHNOLOGIES INC8 citations70
US7327148B2Feb 5, 2008
Method for using internal semiconductor junctions to aid in non-contact testing
AGILENT TECHNOLOGIES INC3 citations59