Inventor
ROSENGAUS ELIEZER
US37 patents
⚠️ This page may combine multiple inventors who share the name “ROSENGAUS ELIEZER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR CORP
12 patentsUS6020957AFeb 1, 2000
System and method for inspecting semiconductor wafers
KLA TENCOR CORP205 citations99
US6791680B1Sep 14, 2004
System and method for inspecting semiconductor wafers
KLA TENCOR CORP49 citations96
US9222771B2Dec 29, 2015
Acquisition of information for a construction site
KLA TENCOR CORP36 citations94
US7724362B1May 25, 2010
Oblique incidence macro wafer inspection
KLA TENCOR CORP26 citations92
US7555409B1Jun 30, 2009
Daisy chained topology
KLA TENCOR CORP48 citations92
US7072034B2Jul 4, 2006
Systems and methods for inspection of specimen surfaces
KLA TENCOR CORP48 citations87
US7719677B2May 18, 2010
Multi-spectral techniques for defocus detection
KLA TENCOR CORP18 citations84
US10535131B2Jan 14, 2020
Systems and methods for region-adaptive defect detection
KLA TENCOR CORP3 citations68
US7865037B1Jan 4, 2011
Memory load balancing
KLA TENCOR CORP2 citations62
US7602958B1Oct 13, 2009
Mirror node process verification
KLA TENCOR CORP5 citations62
US7379838B2May 27, 2008
Programmable image computer
KLA TENCOR CORP2 citations62
US7324198B2Jan 29, 2008
Edge bead removal inspection by reflectometry
KLA TENCOR CORP0 citations52
KLA TENCOR TECH CORP
8 patentsUS7227628B1Jun 5, 2007
Wafer inspection systems and methods for analyzing inspection data
KLA TENCOR TECH CORP58 citations96
US7417724B1Aug 26, 2008
Wafer inspection systems and methods for analyzing inspection data
KLA TENCOR TECH CORP14 citations84
US7397553B1Jul 8, 2008
Surface scanning
KLA TENCOR TECH CORP13 citations84
US7024339B1Apr 4, 2006
Full swath analysis
KLA TENCOR TECH CORP12 citations83
US7251586B2Jul 31, 2007
Full swath analysis
KLA TENCOR TECH CORP6 citations73
US7181368B1Feb 20, 2007
Status polling
KLA TENCOR TECH CORP9 citations73
US7149642B1Dec 12, 2006
Programmable image computer
KLA TENCOR TECH CORP7 citations73
US7076390B1Jul 11, 2006
Memory load balancing
KLA TENCOR TECH CORP5 citations62
AMAZON TECH INC
5 patentsUS10498963B1Dec 3, 2019
Motion extracted high dynamic range images
AMAZON TECH INC18 citations93
US10863105B1Dec 8, 2020
High dynamic range imaging for event detection and inventory management
AMAZON TECH INC13 citations85
US11265481B1Mar 1, 2022
Aligning and blending image data from multiple image sensors
AMAZON TECH INC2 citations72
US10999506B1May 4, 2021
Generating motion extracted images
AMAZON TECH INC1 citations72
US11863869B1Jan 2, 2024
Event detection using motion extracted image comparison
AMAZON TECH INC0 citations62