Inventor

MAHER CHRIS

US9 patents

⚠️ This page may combine multiple inventors who share the name “MAHER CHRIS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KLA TENCOR CORP

3 patents

US10832396B2Nov 10, 2020

And noise based care areas

KLA TENCOR CORP8 citations83

US8000922B2Aug 16, 2011

Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm

KLA TENCOR CORP16 citations82

US9489599B2Nov 8, 2016

Decision tree construction for automatic classification of defects on semiconductor wafers

KLA TENCOR CORP0 citations36

BHASKAR KRIS

1 patent

US8126255B2Feb 28, 2012

Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions

BHASKAR KRIS174 citations95

CHEN CHIEN-HUEI ADAM

1 patent

US8135204B1Mar 13, 2012

Computer-implemented methods, carrier media, and systems for creating a defect sample for use in selecting one or more parameters of an inspection recipe

CHEN CHIEN-HUEI ADAM33 citations89

FISCHER VERLYN

1 patent

US8073240B2Dec 6, 2011

Computer-implemented methods, computer-readable media, and systems for identifying one or more optical modes of an inspection system as candidates for use in inspection of a layer of a wafer

FISCHER VERLYN28 citations84

HUET PATRICK

1 patent

US8537349B2Sep 17, 2013

Monitoring of time-varying defect classification performance

HUET PATRICK6 citations67

KLA CORP

1 patent

US11114324B2Sep 7, 2021

Defect candidate generation for inspection

KLA CORP0 citations59

CLEAN WATER SERVICES

1 patent

US10604433B2Mar 31, 2020

Emancipative waste activated sludge stripping to remove internal phosphorus (“eWASSTRIP”)

CLEAN WATER SERVICES1 citations53