Inventor
YAMAGUCHI MASAO
JP169 patents
⚠️ This page may combine multiple inventors who share the name “YAMAGUCHI MASAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
14 patentsUS5774249AJun 30, 1998
Optical exposer unit
TOSHIBA KK80 citations96
US5751462AMay 12, 1998
Multi-beam exposure unit
TOSHIBA KK54 citations96
US6347003B1Feb 12, 2002
Multi-beam laser exposer unit
TOSHIBA KK18 citations93
US5963354AOct 5, 1999
Multi-beam laser exposer unit
TOSHIBA KK19 citations93
US5801746ASep 1, 1998
Image forming apparatus having a plurality of mirror members each capable of moving in a parallel or rotary direction
TOSHIBA KK25 citations93
US5436700AJul 25, 1995
Image forming apparatus with removable process unit and developing device thereof
TOSHIBA KK31 citations93
US6501585B2Dec 31, 2002
Multi-beam exposure apparatus
TOSHIBA KK22 citations92
US6104519AAug 15, 2000
Multi-beam exposure unit
TOSHIBA KK20 citations92
US6100912AAug 8, 2000
Multi-beam exposer unit
TOSHIBA KK29 citations92
US6061162AMay 9, 2000
Multi-beam exposure unit
TOSHIBA KK20 citations92
US6055084AApr 25, 2000
Multi-beam exposure unit
TOSHIBA KK17 citations92
US5995268ANov 30, 1999
Multi-beam exposure unit
TOSHIBA KK37 citations92
US5850306ADec 15, 1998
Optical scanner
TOSHIBA KK23 citations92
US5808772ASep 15, 1998
Optical scanner and image forming apparatus utilizing optical scanner
TOSHIBA KK18 citations92
TOKYO ELECTRON LTD
6 patentsUS5517126AMay 14, 1996
Probe apparatus
TOKYO ELECTRON LTD204 citations99
US5539676AJul 23, 1996
Method of identifying probe position and probing method in prober
TOKYO ELECTRON LTD112 citations98
US5521522AMay 28, 1996
Probe apparatus for testing multiple integrated circuit dies
TOKYO ELECTRON LTD174 citations96
US5422579AJun 6, 1995
Method of identifying probe position and probing method in prober
TOKYO ELECTRON LTD54 citations96
US5614837AMar 25, 1997
Probe apparatus and burn-in apparatus
TOKYO ELECTRON LTD45 citations95
US5510724AApr 23, 1996
Probe apparatus and burn-in apparatus
TOKYO ELECTRON LTD83 citations95
TDK CORP
5 patentsUS6178974B1Jan 30, 2001
Cleaning apparatus and method
TDK CORP48 citations95
US6254688B1Jul 3, 2001
Cleaning method
TDK CORP35 citations92
US6085764AJul 11, 2000
Cleaning apparatus and method
TDK CORP16 citations92
US6040959AMar 21, 2000
Slider with blunt edges
TDK CORP36 citations92
US5993290ANov 30, 1999
Magnetic head grinding method and apparatus
TDK CORP19 citations92
HIROSE ELECTRIC CO LTD
4 patentsUS5234357AAug 10, 1993
Lock mechanism for electrical connector
HIROSE ELECTRIC CO LTD59 citations96
US4906208AMar 6, 1990
Electrical connector
HIROSE ELECTRIC CO LTD28 citations93
US4753608AJun 28, 1988
Electrical connector and its termination method
HIROSE ELECTRIC CO LTD27 citations93
US4718866AJan 12, 1988
Electrical connector shield case and method of making same
HIROSE ELECTRIC CO LTD45 citations93
STEC INC
3 patentsENPLAS CORP
2 patentsYAMAGUCHI MASAO
2 patentsTOSHIBA TEC KK
2 patentsNIPPON SODA CO
2 patentsSHARP KK
1 patentMATSUSHITA ELECTRIC WORKS LTD
1 patentSANYO ELECTRIC CO
1 patentOLYMPUS CORP
1 patentKAWASAKI STEEL CO
1 patentABE YOSHIYUKI
1 patentTOKUYAMA CORP
1 patentHORIBA STEC CO LTD
1 patentTOKYO MAGNETIC PRINTING
1 patentOLYMPUS OPTICAL CO
1 patentShowing the top 50 of 169 patents by PatentIndex Score.