Inventor
GOLBERG BORIS
IL17 patents
⚠️ This page may combine multiple inventors who share the name “GOLBERG BORIS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS ISRAEL LTD
12 patentsUS10481101B2Nov 19, 2019
Asymmetrical magnification inspection system and illumination module
APPLIED MATERIALS ISRAEL LTD2 citations72
US7403336B2Jul 22, 2008
Broadband imaging system and method
APPLIED MATERIALS ISRAEL LTD4 citations62
US10177048B2Jan 8, 2019
System for inspecting and reviewing a sample
APPLIED MATERIALS ISRAEL LTD1 citations61
US12566143B2Mar 3, 2026
Optical inspection systems with pulsed light sources and pulse multiplexing
APPLIED MATERIALS ISRAEL LTD0 citations60
US7315364B2Jan 1, 2008
System for inspecting a surface employing configurable multi angle illumination modes
APPLIED MATERIALS ISRAEL LTD6 citations60
US11448601B2Sep 20, 2022
Method and system for obtaining information from a sample
APPLIED MATERIALS ISRAEL LTD0 citations57
US12436401B2Oct 7, 2025
Polarization optical system
APPLIED MATERIALS ISRAEL LTD0 citations52
US12366525B2Jul 22, 2025
Phase retrieval
APPLIED MATERIALS ISRAEL LTD0 citations52
US12092584B2Sep 17, 2024
High throughput defect detection
APPLIED MATERIALS ISRAEL LTD0 citations51
US9395266B2Jul 19, 2016
On-tool wavefront aberrations measurement system and method
APPLIED MATERIALS ISRAEL LTD0 citations45
US9958670B2May 1, 2018
Scanning system and method for scanning an object
APPLIED MATERIALS ISRAEL LTD0 citations43
US10054551B2Aug 21, 2018
Inspection system and method for inspecting a sample by using a plurality of spaced apart beams
APPLIED MATERIALS ISRAEL LTD0 citations41
APPLIED MATERIALS INC
5 patentsUS6809808B2Oct 26, 2004
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC23 citations92
US7053395B2May 30, 2006
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC10 citations73
US6853475B2Feb 8, 2005
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC11 citations73
US6469784B2Oct 22, 2002
Optical inspection method and apparatus utilizing a variable angle design
APPLIED MATERIALS INC7 citations73
US6750436B2Jun 15, 2004
Focus error detection apparatus and method having dual focus error detection path
APPLIED MATERIALS INC4 citations62