P

Inventor

FIFIELD JOHN A

US166 patents
⚠️ This page may combine multiple inventors who share the name “FIFIELD JOHN A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

42 patents
US5010524AApr 23, 1991

Crosstalk-shielded-bit-line dram

IBM161 citations99
US6753590B2Jun 22, 2004

High impedance antifuse

IBM93 citations98
US6420925B1Jul 16, 2002

Programmable latch device with integrated programmable element

IBM91 citations98
US6346846B1Feb 12, 2002

Methods and apparatus for blowing and sensing antifuses

IBM109 citations98
US6141245AOct 31, 2000

Impedance control using fuses

IBM142 citations98
US6118318ASep 12, 2000

Self biased differential amplifier with hysteresis

IBM105 citations98
US5873053AFeb 16, 1999

On-chip thermometry for control of chip operating temperature

IBM106 citations98
US6373771B1Apr 16, 2002

Integrated fuse latch and shift register for efficient programming and fuse readout

IBM104 citations97
US5134616AJul 28, 1992

Dynamic ram with on-chip ecc and optimized bit and word redundancy

IBM173 citations97
US6384666B1May 7, 2002

Antifuse latch device with controlled current programming and variable trip point

IBM56 citations96
US6177807B1Jan 23, 2001

High frequency valid data strobe

IBM55 citations96
US5761114AJun 2, 1998

Multi-level storage gain cell with stepline

IBM91 citations96
US5307356AApr 26, 1994

Interlocked on-chip ECC system

IBM72 citations96
US6400202B1Jun 4, 2002

Programmable delay element and synchronous DRAM using the same

IBM48 citations95
US5228046AJul 13, 1993

Fault tolerant computer memory systems and components employing dual level error correction and detection with disablement feature

IBM57 citations95
US5058115AOct 15, 1991

Fault tolerant computer memory systems and components employing dual level error correction and detection with lock-up feature

IBM79 citations95
US9000837B1Apr 7, 2015

Adjustable reference voltage generator for single-ended DRAM sensing devices

IBM29 citations94
US5535226AJul 9, 1996

On-chip ECC status

IBM54 citations94
US7904658B2Mar 8, 2011

Structure for power-efficient cache memory

IBM27 citations93
US7466188B2Dec 16, 2008

Stress control mechanism for use in high-voltage applications in an integrated circuit

IBM27 citations93
US7442583B2Oct 28, 2008

Using electrically programmable fuses to hide architecture, prevent reverse engineering, and make a device inoperable

IBM21 citations93
US7336095B2Feb 26, 2008

Changing chip function based on fuse states

IBM31 citations93
US7268577B2Sep 11, 2007

Changing chip function based on fuse states

IBM21 citations93
US7085971B2Aug 1, 2006

ECC based system and method for repairing failed memory elements

IBM30 citations93
US7061308B2Jun 13, 2006

Voltage divider for integrated circuits

IBM20 citations93
US7061304B2Jun 13, 2006

Fuse latch with compensated programmable resistive trip point

IBM18 citations93
US6631503B2Oct 7, 2003

Temperature programmable timing delay system

IBM43 citations93
US6621324B2Sep 16, 2003

Redundant antifuse segments for improved programming efficiency

IBM51 citations93
US6577154B2Jun 10, 2003

Constant impedance driver for high speed interface

IBM25 citations93
US6496037B1Dec 17, 2002

Automatic off-chip driver adjustment based on load characteristics

IBM26 citations93
US6281731B1Aug 28, 2001

Control of hysteresis characteristic within a CMOS differential receiver

IBM32 citations93
US6166561ADec 26, 2000

Method and apparatus for protecting off chip driver circuitry employing a split rail power supply

IBM24 citations93
US5757693AMay 26, 1998

Gain memory cell with diode

IBM28 citations93
US6794901B2Sep 21, 2004

Apparatus for reducing soft errors in dynamic circuits

IBM33 citations92
US6438051B1Aug 20, 2002

Stabilized direct sensing memory architecture

IBM27 citations92
US6243283B1Jun 5, 2001

Impedance control using fuses

IBM42 citations92
US5638385AJun 10, 1997

Fast check bit write for a semiconductor memory

IBM40 citations92
US5604755AFeb 18, 1997

Memory system reset circuit

IBM50 citations92
US5581567ADec 3, 1996

Dual level error detection and correction employing data subsets from previously corrected data

IBM33 citations92
US5533036AJul 2, 1996

Fault tolerant computer memory systems and components employing dual level error correction and detection with disablement feature

IBM36 citations92
US6956417B2Oct 18, 2005

Leakage compensation circuit

IBM32 citations91
US6348827B1Feb 19, 2002

Programmable delay element and synchronous DRAM using the same

IBM24 citations91

OLDCASTLE INC

5 patents

GLOBALFOUNDRIES INC

2 patents

OLDCASTLE PRECAST INC

1 patent

Showing the top 50 of 166 patents by PatentIndex Score.