Inventor
XU JEFF J
TW59 patents
⚠️ This page may combine multiple inventors who share the name “XU JEFF J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
17 patentsUS8497177B1Jul 30, 2013
Method of making a FinFET device
TAIWAN SEMICONDUCTOR MFG252 citations99
US8367498B2Feb 5, 2013
Fin-like field effect transistor (FinFET) device and method of manufacturing same
TAIWAN SEMICONDUCTOR MFG267 citations99
US8053299B2Nov 8, 2011
Method of fabrication of a FinFET element
TAIWAN SEMICONDUCTOR MFG244 citations99
US8039179B2Oct 18, 2011
Integrated circuit layout design
TAIWAN SEMICONDUCTOR MFG121 citations99
US7910453B2Mar 22, 2011
Storage nitride encapsulation for non-planar sonos NAND flash charge retention
TAIWAN SEMICONDUCTOR MFG396 citations99
US7989355B2Aug 2, 2011
Method of pitch halving
TAIWAN SEMICONDUCTOR MFG58 citations98
US7862962B2Jan 4, 2011
Integrated circuit layout design
TAIWAN SEMICONDUCTOR MFG46 citations98
US9190417B2Nov 17, 2015
Fin-like field effect transistor (FinFET) device and method of manufacturing same
TAIWAN SEMICONDUCTOR MFG13 citations93
US9147594B2Sep 29, 2015
Method for fabricating a strained structure
TAIWAN SEMICONDUCTOR MFG13 citations93
US9142643B2Sep 22, 2015
Method for forming epitaxial feature
TAIWAN SEMICONDUCTOR MFG25 citations93
US8367534B2Feb 5, 2013
Non-uniformity reduction in semiconductor planarization
TAIWAN SEMICONDUCTOR MFG16 citations93
US7915112B2Mar 29, 2011
Metal gate stress film for mobility enhancement in FinFET device
TAIWAN SEMICONDUCTOR MFG36 citations89
US9006056B2Apr 14, 2015
Method for reducing interfacial layer thickness for high-k and metal gate stack
TAIWAN SEMICONDUCTOR MFG4 citations84
US9105624B2Aug 11, 2015
Techniques providing metal gate devices with multiple barrier layers
TAIWAN SEMICONDUCTOR MFG3 citations74
US9202915B2Dec 1, 2015
Method of forming epi film in substrate trench
TAIWAN SEMICONDUCTOR MFG4 citations73
US8524587B2Sep 3, 2013
Non-uniformity reduction in semiconductor planarization
TAIWAN SEMICONDUCTOR MFG2 citations63
US7939353B1May 10, 2011
Methods of forming integrated circuits
TAIWAN SEMICONDUCTOR MFG4 citations63
TAIWAN SEMICONDUCTOR MFG CO LTD
15 patentsUS9564529B2Feb 7, 2017
Method for fabricating a strained structure and structure formed
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations93
US11171134B2Nov 9, 2021
Techniques providing metal gate devices with multiple barrier layers
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations84
US9660082B2May 23, 2017
Integrated circuit transistor structure with high germanium concentration SiGe stressor
TAIWAN SEMICONDUCTOR MFG CO LTD11 citations84
US10468408B2Nov 5, 2019
Fin-like field effect transistor (FinFET) device and method of manufacturing same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9911735B2Mar 6, 2018
Fin-like field effect transistor (FinFET) device and method of manufacturing same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9831243B2Nov 28, 2017
Techniques providing metal gate devices with multiple barrier layers
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9647118B2May 9, 2017
Device having EPI film in substrate trench
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US12356674B2Jul 8, 2025
Method for fabricating a strained structure and structure formed
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11855210B2Dec 26, 2023
Method for fabricating a strained structure and structure formed
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11251303B2Feb 15, 2022
Method for fabricating a strained structure and structure formed
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US10998442B2May 4, 2021
Method for fabricating a strained structure and structure formed
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US10818661B2Oct 27, 2020
Fin-like field effect transistor (FinFET) device and method of manufacturing same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10693003B2Jun 23, 2020
Integrated circuit transistor structure with high germanium concentration SiGe stressor
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10522544B2Dec 31, 2019
Techniques providing metal gate devices with multiple barrier layers
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10510887B2Dec 17, 2019
Method for fabricating a strained structure and structure formed
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
XU JEFF J
8 patentsUS8415718B2Apr 9, 2013
Method of forming epi film in substrate trench
XU JEFF J197 citations99
US8597995B2Dec 3, 2013
Metal gate device with low temperature oxygen scavenging
XU JEFF J22 citations92
US8304841B2Nov 6, 2012
Metal gate transistor, integrated circuits, systems, and fabrication methods thereof
XU JEFF J22 citations89
US9166022B2Oct 20, 2015
Fin-like field effect transistor (FinFET) device and method of manufacturing same
XU JEFF J13 citations84
US8704280B2Apr 22, 2014
Semiconductor device with strained channels induced by high-k capping metal layers
XU JEFF J14 citations84
US8648400B2Feb 11, 2014
FinFET semiconductor device with germanium (GE) fins
XU JEFF J9 citations84
US8334570B2Dec 18, 2012
Metal gate stress film for mobility enhancement in FinFET device
XU JEFF J12 citations80
US8106469B2Jan 31, 2012
Methods and apparatus of fluorine passivation
XU JEFF J3 citations62
YAO LIANG-GI
3 patentsUS8470659B2Jun 25, 2013
Method for reducing interfacial layer thickness for high-k and metal gate stack
YAO LIANG-GI5 citations83
US8268683B2Sep 18, 2012
Method for reducing interfacial layer thickness for high-K and metal gate stack
YAO LIANG-GI6 citations83
US9040393B2May 26, 2015
Method of forming semiconductor structure
YAO LIANG-GI2 citations61
FANG ZIWEI
2 patentsLEE TSUNG-LIN
1 patentCHANG CHIH-HAO
1 patentLIN CHIN-HSIANG
1 patentSHIEH MING-FENG
1 patentYu xiong-fei
1 patentShowing the top 50 of 59 patents by PatentIndex Score.