Inventor
VATS SHIV KUMAR
IN7 patents
Patents
7 patentsUS11714131B1Aug 1, 2023
Circuit and method for scan testing
ST MICROELECTRONICS INT NV7 citations83
US10802077B1Oct 13, 2020
Test circuit for dynamic checking for faults on functional and BIST clock paths to memory in both ATPG and LBIST modes
ST MICROELECTRONICS INT NV10 citations79
US11726140B2Aug 15, 2023
Scan circuit and method
ST MICROELECTRONICS INT NV2 citations69
US12366605B2Jul 22, 2025
Area, cost, and time-effective scan coverage improvement
ST MICROELECTRONICS INT NV0 citations60
US12360161B2Jul 15, 2025
Scan circuit and method
ST MICROELECTRONICS INT NV0 citations59
US12345764B2Jul 1, 2025
Test pattern generation using multiple scan enables
ST MICROELECTRONICS INT NV0 citations59
US12517544B2Jan 6, 2026
Power reduction and effective timing exceptions handling in at-speed capture
ST MICROELECTRONICS INT NV0 citations48