Inventor
SRIVASTAVA UMESH CHANDRA
IN5 patents
Patents
5 patentsUS11714131B1Aug 1, 2023
Circuit and method for scan testing
ST MICROELECTRONICS INT NV7 citations83
US12366605B2Jul 22, 2025
Area, cost, and time-effective scan coverage improvement
ST MICROELECTRONICS INT NV0 citations60
US12345764B2Jul 1, 2025
Test pattern generation using multiple scan enables
ST MICROELECTRONICS INT NV0 citations59
US12146911B1Nov 19, 2024
TVF transition coverage with self-test and production-test time reduction
ST MICROELECTRONICS INT NV1 citations58
US12517544B2Jan 6, 2026
Power reduction and effective timing exceptions handling in at-speed capture
ST MICROELECTRONICS INT NV0 citations48