Inventor
RYU SUNGYOON
KR9 patents
⚠️ This page may combine multiple inventors who share the name “RYU SUNGYOON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
8 patentsUS12578467B2Mar 17, 2026
Light detection and ranging (LiDAR)-based inspection device and method of manufacturing semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations60
US12385946B2Aug 12, 2025
Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations58
US12474260B2Nov 18, 2025
Terahertz signal measuring apparatus and measuring method
SAMSUNG ELECTRONICS CO LTD0 citations57
US11988495B2May 21, 2024
Through-focus image-based metrology device, operation method thereof, and computing device for executing the operation
SAMSUNG ELECTRONICS CO LTD1 citations56
US11921270B2Mar 5, 2024
Inspection system including reference specimen and method of forming semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations52
US12590900B2Mar 31, 2026
Wafer inspection apparatus using three-dimensional image and method of inspecting wafer using the same
SAMSUNG ELECTRONICS CO LTD0 citations49
US12092656B2Sep 17, 2024
Test apparatus and test method thereof
SAMSUNG ELECTRONICS CO LTD0 citations47
US11428645B2Aug 30, 2022
Wafer inspection device and method of manufacturing semiconductor device by using the wafer inspection device
SAMSUNG ELECTRONICS CO LTD0 citations36