P

Inventor

CHUANG LI-YANG

TW17 patents

Patents

17 patents
US11296082B2Apr 5, 2022

Multi-gate device and related methods

TAIWAN SEMICONDUCTOR MFG CO LTD6 citations86
US11688736B2Jun 27, 2023

Multi-gate device and related methods

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11575034B2Feb 7, 2023

Back end of line nanowire power switch transistors

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11245028B2Feb 8, 2022

Isolation structures of semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10971609B2Apr 6, 2021

Back end of line nanowire power switch transistors

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10964816B2Mar 30, 2021

Method and device for boosting performance of FinFETs via strained spacer

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11217676B1Jan 4, 2022

Antenna-free high-k gate dielectric for a gate-all-around transistor and methods of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations72
US12490476B2Dec 2, 2025

Method and device for boosting performance of FinFETs via strained spacer

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12396191B2Aug 19, 2025

Isolation structures of semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12317528B2May 27, 2025

Gate isolation feature and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12166036B2Dec 10, 2024

Multi-gate device and related methods

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12148830B2Nov 19, 2024

Method and device for boosting performance of FinFETs via strained spacer

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12062714B2Aug 13, 2024

Back end of line nanowire power switch transistors

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12051738B2Jul 30, 2024

Isolation structures of semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12021136B2Jun 25, 2024

Gate isolation feature and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11664451B2May 30, 2023

Method and device for boosting performance of FinFETs via strained spacer

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11799019B2Oct 24, 2023

Gate isolation feature and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52