Inventor
KOYANAGI HAJIME
JP19 patents
⚠️ This page may combine multiple inventors who share the name “KOYANAGI HAJIME”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
7 patentsUS5436448AJul 25, 1995
Surface observing apparatus and method
HITACHI LTD134 citations98
US6370107B1Apr 9, 2002
Recording medium and recording device
HITACHI LTD50 citations92
US5808977ASep 15, 1998
Tracking method and recording means thereby
HITACHI LTD45 citations92
US5627815AMay 6, 1997
Precision machining method precision machining apparatus and data storage apparatus using the same
HITACHI LTD22 citations92
US5471064ANov 28, 1995
Precision machining method, precision machining apparatus and data storage apparatus using the same
HITACHI LTD24 citations92
US5467642ANov 21, 1995
Scanning probe microscope and method of control error correction
HITACHI LTD46 citations90
US6246652B1Jun 12, 2001
Device using sensor for small rotation angle
HITACHI LTD13 citations73
PIONEER ELECTRONIC CORP
7 patentsUS6442125B1Aug 27, 2002
Optical pickup
PIONEER ELECTRONIC CORP23 citations92
US5633844AMay 27, 1997
Optical pickup device with three beam tracking servo control using oval beams
PIONEER ELECTRONIC CORP28 citations92
US5457670AOct 10, 1995
Optical disk information recording apparatus and reproducing apparatus having a plurality of read or write beams
PIONEER ELECTRONIC CORP35 citations92
US6370092B1Apr 9, 2002
Optical pickup and optical disk drive for use with a high-density optical disk
PIONEER ELECTRONIC CORP18 citations84
US5889752AMar 30, 1999
Optical pickup apparatus with a crosstalk balance detecting circuit
PIONEER ELECTRONIC CORP15 citations74
US5572493ANov 5, 1996
Optical disk information recording apparatus and reproducing apparatus having a plurality of read or write beams
PIONEER ELECTRONIC CORP10 citations74
US5784345AJul 21, 1998
Optical pickup device for eliminating unwanted data
PIONEER ELECTRONIC CORP4 citations63
HITACHI HIGH TECH CORP
3 patentsUS7750296B2Jul 6, 2010
Scanning electron microscope and calibration of image distortion
HITACHI HIGH TECH CORP3 citations62
US7612334B2Nov 3, 2009
Standard reference component for calibration, fabrication method for the same, and scanning electron microscope using the same
HITACHI HIGH TECH CORP5 citations62
US7683313B2Mar 23, 2010
Charged particle beam measurement equipment, size correction and standard sample for correction
HITACHI HIGH TECH CORP0 citations41