P

Inventor

NGAN KENNY KING-TAI

US37 patents

Patents

37 patents
US5746460AMay 5, 1998

End effector for semiconductor wafer transfer device and method of moving a wafer with an end effector

APPLIED MATERIALS INC164 citations99
US6110836AAug 29, 2000

Reactive plasma etch cleaning of high aspect ratio openings

APPLIED MATERIALS INC257 citations98
US6945857B1Sep 20, 2005

Polishing pad conditioner and methods of manufacture and recycling

APPLIED MATERIALS INC111 citations97
US6051114AApr 18, 2000

Use of pulsed-DC wafer bias for filling vias/trenches with metal in HDP physical vapor deposition

APPLIED MATERIALS INC304 citations97
US6346489B1Feb 12, 2002

Precleaning process for metal plug that minimizes damage to low-κ dielectric

APPLIED MATERIALS INC61 citations96
US6045666AApr 4, 2000

Aluminum hole filling method using ionized metal adhesion layer

APPLIED MATERIALS INC61 citations96
US5925225AJul 20, 1999

Method of producing smooth titanium nitride films having low resistivity

APPLIED MATERIALS INC41 citations96
US5707498AJan 13, 1998

Avoiding contamination from induction coil in ionized sputtering

APPLIED MATERIALS INC79 citations96
US7066795B2Jun 27, 2006

Polishing pad conditioner with shaped abrasive patterns and channels

APPLIED MATERIALS INC87 citations94
US6313042B1Nov 6, 2001

Cleaning contact with successive fluorine and hydrogen plasmas

APPLIED MATERIALS INC56 citations94
US7504008B2Mar 17, 2009

Refurbishment of sputtering targets

APPLIED MATERIALS INC33 citations93
US6420260B1Jul 16, 2002

Ti/Tinx underlayer which enables a highly <111> oriented aluminum interconnect

APPLIED MATERIALS INC34 citations93
US6176978B1Jan 23, 2001

Pasting layer formation method for high density plasma deposition chambers

APPLIED MATERIALS INC31 citations93
US6149784ANov 21, 2000

Sputtering chamber shield promoting reliable plasma ignition

APPLIED MATERIALS INC66 citations93
US5943600AAug 24, 1999

Treatment of a titanium nitride layer to improve resistance to elevated temperatures

APPLIED MATERIALS INC40 citations93
US5759360AJun 2, 1998

Wafer clean sputtering process

APPLIED MATERIALS INC51 citations93
US7053002B2May 30, 2006

Plasma preclean with argon, helium, and hydrogen gases

APPLIED MATERIALS INC19 citations92
US7014887B1Mar 21, 2006

Sequential sputter and reactive precleans of vias and contacts

APPLIED MATERIALS INC26 citations92
US6672864B2Jan 6, 2004

Method and apparatus for processing substrates in a system having high and low pressure areas

APPLIED MATERIALS INC36 citations92
US6589890B2Jul 8, 2003

Precleaning process for metal plug that minimizes damage to low-κ dielectric

APPLIED MATERIALS INC32 citations92
US6372301B1Apr 16, 2002

Method of improving adhesion of diffusion layers on fluorinated silicon dioxide

APPLIED MATERIALS INC25 citations92
US6267423B1Jul 31, 2001

End effector for semiconductor wafer transfer device and method of moving a wafer with an end effector

APPLIED MATERIALS INC40 citations92
US6238533B1May 29, 2001

Integrated PVD system for aluminum hole filling using ionized metal adhesion layer

APPLIED MATERIALS INC33 citations92
US5972178AOct 26, 1999

Continuous process for forming improved titanium nitride barrier layers

APPLIED MATERIALS INC52 citations92
US5697427ADec 16, 1997

Apparatus and method for cooling a substrate

APPLIED MATERIALS INC29 citations92
US7041200B2May 9, 2006

Reducing particle generation during sputter deposition

APPLIED MATERIALS INC45 citations91
US6077353AJun 20, 2000

Pedestal insulator for a pre-clean chamber

APPLIED MATERIALS INC35 citations90
US5882399AMar 16, 1999

Method of forming a barrier layer which enables a consistently highly oriented crystalline structure in a metallic interconnect

APPLIED MATERIALS INC52 citations90
US6426282B1Jul 30, 2002

Method of forming solder bumps on a semiconductor wafer

APPLIED MATERIALS INC28 citations89
US7323230B2Jan 29, 2008

Coating for aluminum component

APPLIED MATERIALS INC9 citations84
US7006888B2Feb 28, 2006

Semiconductor wafer preheating

APPLIED MATERIALS INC8 citations74
US6207027B1Mar 27, 2001

Method to reduce overhead time in an ion metal plasma process

APPLIED MATERIALS INC10 citations74
US6149777ANov 21, 2000

Method of producing smooth titanium nitride films having low resistivity

APPLIED MATERIALS INC6 citations74
US6071811AJun 6, 2000

Deposition of titanium nitride films having improved uniformity

APPLIED MATERIALS INC13 citations74
US6059872AMay 9, 2000

Smooth titanium nitride films having low resistivity

APPLIED MATERIALS INC11 citations74
US5919342AJul 6, 1999

Method for depositing golden titanium nitride

APPLIED MATERIALS INC9 citations74
US6899799B2May 31, 2005

Method and apparatus for improving sidewall coverage during sputtering in a chamber having an inductively coupled plasma

APPLIED MATERIALS INC6 citations68