Inventor
YAMASAKI KYOJI
JP30 patents
⚠️ This page may combine multiple inventors who share the name “YAMASAKI KYOJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
24 patentsUS6433422B1Aug 13, 2002
Semiconductor integrated circuit having semiconductor packages for mounting integrated circuit chips on both sides of a substrate
MITSUBISHI ELECTRIC CORP90 citations98
US6285622B1Sep 4, 2001
Semiconductor device
MITSUBISHI ELECTRIC CORP142 citations97
US6339357B1Jan 15, 2002
Semiconductor integrated circuit device capable of externally monitoring internal voltage
MITSUBISHI ELECTRIC CORP62 citations96
US6519194B2Feb 11, 2003
Semiconductor memory device with a rapid packet data input, capable of operation check with low speed tester
MITSUBISHI ELECTRIC CORP61 citations95
US6594167B1Jul 15, 2003
Semiconductor integrated circuit having a structure for equalizing interconnection lengths and memory module provided with the semiconductor integrated circuit
MITSUBISHI ELECTRIC CORP36 citations93
US6330173B1Dec 11, 2001
Semiconductor integrated circuit comprising step-up voltage generation circuit
MITSUBISHI ELECTRIC CORP20 citations93
US6065143AMay 16, 2000
Semiconductor memory device capable of fast testing without externally considering address scramble or data scramble
MITSUBISHI ELECTRIC CORP39 citations93
US5859799AJan 12, 1999
Semiconductor memory device including internal power supply circuit generating a plurality of internal power supply voltages at different levels
MITSUBISHI ELECTRIC CORP32 citations93
US5789808AAug 4, 1998
Semiconductor device structured to be less susceptible to power supply noise
MITSUBISHI ELECTRIC CORP19 citations93
US5757175AMay 26, 1998
Constant current generating circuit
MITSUBISHI ELECTRIC CORP27 citations93
US6631092B2Oct 7, 2003
Semiconductor memory device capable of imposing large stress on transistor
MITSUBISHI ELECTRIC CORP19 citations92
US6404687B2Jun 11, 2002
Semiconductor integrated circuit having a self-refresh function
MITSUBISHI ELECTRIC CORP32 citations92
US6301190B1Oct 9, 2001
Semiconductor memory device with a rapid packet data input, capable of operation check with low speed tester
MITSUBISHI ELECTRIC CORP19 citations92
US5716889AFeb 10, 1998
Method of arranging alignment marks
MITSUBISHI ELECTRIC CORP40 citations92
US6147398ANov 14, 2000
Semiconductor device package
MITSUBISHI ELECTRIC CORP16 citations77
US6498760B2Dec 24, 2002
Semiconductor device having test mode
MITSUBISHI ELECTRIC CORP10 citations74
US6486731B2Nov 26, 2002
Semiconductor integrated circuit device capable of externally monitoring internal voltage
MITSUBISHI ELECTRIC CORP11 citations74
US6064557AMay 16, 2000
Semiconductor device structured to be less susceptible to power supply noise
MITSUBISHI ELECTRIC CORP5 citations74
US6005294ADec 21, 1999
Method of arranging alignment marks
MITSUBISHI ELECTRIC CORP15 citations74
US5978299ANov 2, 1999
Semiconductor memory device having a voltage lowering circuit of which supplying capability increases when column system is in operation
MITSUBISHI ELECTRIC CORP8 citations74
US5973554AOct 26, 1999
Semiconductor device structured to be less susceptible to power supply noise
MITSUBISHI ELECTRIC CORP11 citations74
US5875145AFeb 23, 1999
Semiconductor memory device having a voltage lowering circuit of which supplying capability increases when column system is in operation
MITSUBISHI ELECTRIC CORP8 citations74
US5291454AMar 1, 1994
Circuit for decreasing current consumption in data output circuit in case one of two supply voltages fails
MITSUBISHI ELECTRIC CORP16 citations74
US6657879B2Dec 2, 2003
Semiconductor integrated circuit device with noise filter
MITSUBISHI ELECTRIC CORP2 citations63
RENESAS TECH CORP
4 patentsUS6809576B1Oct 26, 2004
Semiconductor integrated circuit device having two types of internal power supply circuits
RENESAS TECH CORP36 citations92
US7161387B2Jan 9, 2007
Semiconductor device and level conversion circuit
RENESAS TECH CORP12 citations84
US6661729B2Dec 9, 2003
Semiconductor device having test mode
RENESAS TECH CORP15 citations84
US7288965B2Oct 30, 2007
Semiconductor device and level conversion circuit
RENESAS TECH CORP4 citations63