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Inventor
LIU SHENG-CHIEH
TW
2 patents
Patents
2 patents
US7494830B2
Feb 24, 2009
Method and device for wafer backside alignment overlay accuracy
TAIWAN SEMICONDUCTOR MFG
23 citations
88
US7611960B2
Nov 3, 2009
Method and system for wafer backside alignment
TAIWAN SEMICONDUCTOR MFG
5 citations
58