Inventor

NAGASHIMA HIROKAZU

JP13 patents

⚠️ This page may combine multiple inventors who share the name “NAGASHIMA HIROKAZU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NEC CORP

4 patents

US5604703AFeb 18, 1997

Semiconductor memory device with error check-correction function permitting reduced read-out time

NEC CORP61 citations94

US6442081B1Aug 27, 2002

Semiconductor storage device data sensing method and apparatus

NEC CORP12 citations72

US5642319AJun 24, 1997

High-speed read-out semiconductor memory

NEC CORP5 citations61

US5768209AJun 16, 1998

Semiconductor memory with NAND type memory cells having NOR gate operation delay means

NEC CORP1 citations51

FUJITSU LTD

2 patents

US6826081B2Nov 30, 2004

Nonvolatile semiconductor memory device, nonvolatile semiconductor memory device-integrated system, and defective block detecting method

FUJITSU LTD27 citations92

US6788588B2Sep 7, 2004

Asynchronous semiconductor memory device

FUJITSU LTD13 citations83

TOSHIBA KK

2 patents

US7831644B2Nov 9, 2010

Electronic apparatus and content data providing method

TOSHIBA KK12 citations80

US7761614B2Jul 20, 2010

Electronic apparatus and content data providing method

TOSHIBA KK0 citations38

SPANSION LLC

2 patents

US7679968B2Mar 16, 2010

Enhanced erasing operation for non-volatile memory

SPANSION LLC2 citations60

US7787312B2Aug 31, 2010

Semiconductor device and controlling method for the same

SPANSION LLC1 citations50

YOKOGAWA ELECTRIC CORP

2 patents

US11022512B2Jun 1, 2021

Measurement system, measurement method, and pressure measurement apparatus

YOKOGAWA ELECTRIC CORP1 citations53

US10620074B2Apr 14, 2020

Pressure gauge with variable measurement range and display thereof

YOKOGAWA ELECTRIC CORP0 citations46

NAGASHIMA HIROKAZU

1 patent

US8423705B2Apr 16, 2013

Semiconductor device and method for controlling thereof

NAGASHIMA HIROKAZU0 citations32