P

Inventor

GARG AKHIL

IN14 patents
⚠️ This page may combine multiple inventors who share the name “GARG AKHIL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ST MICROELECTRONICS INT NV

3 patents
US8381051B2Feb 19, 2013

Testing of multi-clock domains

ST MICROELECTRONICS INT NV5 citations82
US8352781B2Jan 8, 2013

System and method for efficient detection and restoration of data storage array defects

ST MICROELECTRONICS INT NV2 citations62
US8527824B2Sep 3, 2013

Testing of multi-clock domains

ST MICROELECTRONICS INT NV4 citations61

STERLITE TECH LTD

3 patents
US11300741B2Apr 12, 2022

Leaf shaped intermittent bonded optical fibre ribbon

STERLITE TECH LTD1 citations61
US11953749B2Apr 9, 2024

Intermittently bonded ribbon with colored bonds

STERLITE TECH LTD0 citations58
US12032217B2Jul 9, 2024

Cable with interstitial fillers and edge ribbons

STERLITE TECH LTD1 citations57

ST MICROELECTRONICS PVT LTD

2 patents
US7954017B2May 31, 2011

Multiple embedded memories and testing components for the same

ST MICROELECTRONICS PVT LTD8 citations82
US8386864B2Feb 26, 2013

Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces

ST MICROELECTRONICS PVT LTD7 citations81

CADENCE DESIGN SYSTEMS INC

2 patents
US10222417B1Mar 5, 2019

Securing access to integrated circuit scan mode and data

CADENCE DESIGN SYSTEMS INC7 citations79
US10747922B1Aug 18, 2020

Test circuitry with annularly arranged compressor and decompressor elements

CADENCE DESIGN SYSTEMS INC0 citations39

NXP BV

2 patents
US12553942B2Feb 17, 2026

Test for source synchronous interfaces

NXP BV0 citations59
US12401349B2Aug 26, 2025

Single event upset hardened flip-flop and methods of operation

NXP BV0 citations38

DUBEY PRASHANT

1 patent
US8108744B2Jan 31, 2012

Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces

DUBEY PRASHANT11 citations80

NXP USA INC

1 patent
US11320485B1May 3, 2022

Scan wrapper architecture for system-on-chip

NXP USA INC2 citations69