Inventor

OKAMOTO YOSUKE

JP20 patents

⚠️ This page may combine multiple inventors who share the name “OKAMOTO YOSUKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

OKAMOTO YOSUKE

TOSHIBA KK

X-ray CT apparatus and image processing apparatus

Method for measuring pattern misalignment

Measurement mark, method for measurement, and measurement apparatus

Dose-data generating apparatus

Method for estimating scattered ray intensity in X-ray CT and X-ray CT apparatus

EUV mask

Exposure apparatus, exposure method, and method of manufacturing semiconductor device

TOSHIBA MEMORY CORP

Positional deviation measuring device, non-transitory computer-readable recording medium containing a positional deviation measuring program, and method of manufacturing semiconductor device

Imprint device and pattern forming method

Position measuring method, position measuring apparatus, and semiconductor device manufacturing method

Pattern accuracy detecting apparatus and processing system

OKAMOTO YOSUKE

Mask and method for fabricating semiconductor device

Dose-data generating apparatus, dose-data generating method, and manufacturing method of semiconductor device

TANIZAKI HIROYUKI

Unevenness inspection method, method for manufacturing display panel, and unevenness inspection apparatus

SUMITOMO WIRING SYSTEMS

Power supply circuit structure comprising a current sensor, and method of assembling the same

TASMIT INC

Pattern-edge detection method, pattern-edge detection apparatus, and storage medium storing program for causing a computer to perform pattern-edge detection

AIST

Device for transmitting speech information

OKUDA KENTARO

Photomask and method for manufacturing the same

HAGIO YOSHINORI

Pattern forming method, positional deviation measuring method and photomask

KOIKE TAKASHI

Method for making correction map of dose amount, exposure method, and method for manufacturing semiconductor device