Inventor
MATOBA YOSHIKI
JP33 patents
⚠️ This page may combine multiple inventors who share the name “MATOBA YOSHIKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SII NANOTECHNOLOGY INC
14 patentsUS8000439B2Aug 16, 2011
X-ray analyzer and X-ray analysis method
SII NANOTECHNOLOGY INC22 citations92
US7627088B2Dec 1, 2009
X-ray tube and X-ray analysis apparatus
SII NANOTECHNOLOGY INC20 citations92
US7436926B2Oct 14, 2008
Fluorescent X-ray analysis apparatus
SII NANOTECHNOLOGY INC19 citations92
US7970101B2Jun 28, 2011
X-ray analyzer and X-ray analysis method
SII NANOTECHNOLOGY INC23 citations91
US7680248B2Mar 16, 2010
X-ray tube and X-ray analyzing apparatus
SII NANOTECHNOLOGY INC16 citations84
US7634053B2Dec 15, 2009
Fluorescent X-ray analysis apparatus
SII NANOTECHNOLOGY INC14 citations84
US7634054B2Dec 15, 2009
X-ray tube and X-ray analysis apparatus
SII NANOTECHNOLOGY INC12 citations84
US7587025B2Sep 8, 2009
X-ray analysis apparatus and X-ray analysis method
SII NANOTECHNOLOGY INC16 citations83
US7428293B2Sep 23, 2008
Fluorescent X-ray analysis apparatus
SII NANOTECHNOLOGY INC16 citations83
US7424093B2Sep 9, 2008
Fluorescent x-ray analysis apparatus
SII NANOTECHNOLOGY INC14 citations83
US7623627B2Nov 24, 2009
X-ray analysis apparatus and X-ray analysis method
SII NANOTECHNOLOGY INC2 citations63
US7289598B2Oct 30, 2007
X-ray fluorescent analysis apparatus
SII NANOTECHNOLOGY INC6 citations63
US7022996B2Apr 4, 2006
Radiation detector
SII NANOTECHNOLOGY INC6 citations63
US7529337B2May 5, 2009
Energy dispersion type radiation detecting system and method of measuring content of object element
SII NANOTECHNOLOGY INC3 citations62
HITACHI HIGH TECH SCIENCE CORP
9 patentsUS9213007B2Dec 15, 2015
Foreign matter detector
HITACHI HIGH TECH SCIENCE CORP10 citations84
US9188553B2Nov 17, 2015
X-ray fluorescence analyzer
HITACHI HIGH TECH SCIENCE CORP7 citations82
US11022570B2Jun 1, 2021
X-ray transmission inspection apparatus and X-ray transmission inspection method
HITACHI HIGH TECH SCIENCE CORP3 citations73
US10823686B2Nov 3, 2020
X-ray inspection method and X-ray inspection device
HITACHI HIGH TECH SCIENCE CORP5 citations73
US9001966B2Apr 7, 2015
Transmission X-ray analyzer
HITACHI HIGH TECH SCIENCE CORP4 citations73
US10054555B2Aug 21, 2018
X-ray transmission inspection apparatus and inspection method using the same
HITACHI HIGH TECH SCIENCE CORP3 citations67
US10847355B2Nov 24, 2020
Mass analysis apparatus and method
HITACHI HIGH TECH SCIENCE CORP0 citations45
US10636638B2Apr 28, 2020
Mass analysis apparatus and method
HITACHI HIGH TECH SCIENCE CORP0 citations45
US10651018B2May 12, 2020
Apparatus for and method of mass analysis
HITACHI HIGH TECH SCIENCE CORP0 citations39
MATOBA YOSHIKI
5 patentsUS8891729B2Nov 18, 2014
X-ray analyzer and X-ray analysis method
MATOBA YOSHIKI8 citations83
US8068583B2Nov 29, 2011
X-ray analysis apparatus and X-ray analysis method
MATOBA YOSHIKI7 citations81
US8912503B2Dec 16, 2014
Transmission X-ray analyzer and transmission X-ray analysis method
MATOBA YOSHIKI4 citations72
US8596866B2Dec 3, 2013
X-ray transmission inspection apparatus and x-ray transmission inspection method
MATOBA YOSHIKI2 citations62
US8422630B2Apr 16, 2013
X-ray inspection device and X-ray inspection method
MATOBA YOSHIKI4 citations62
HITACHI HIGH-TECH SCIENCE CORP
3 patentsUS9863896B2Jan 9, 2018
X-ray transmission inspection apparatus
HITACHI HIGH-TECH SCIENCE CORP5 citations73
US9410906B2Aug 9, 2016
X-ray fluorescence spectrometer comprising a temperature sensor, two external-air fans, and a circulation fan
HITACHI HIGH-TECH SCIENCE CORP4 citations72
US9400255B2Jul 26, 2016
X-ray fluorescence spectrometer comprising a gas blowing mechanism
HITACHI HIGH-TECH SCIENCE CORP2 citations56