Inventor
WAGNER GRANT
US17 patents
⚠️ This page may combine multiple inventors who share the name “WAGNER GRANT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
12 patentsUS11322473B2May 3, 2022
Interconnect and tuning thereof
IBM2 citations67
US11009545B2May 18, 2021
Integrated circuit tester probe contact liner
IBM0 citations62
US8020213B2Sep 13, 2011
Access control method and a system for privacy protection
IBM3 citations60
US11041879B2Jun 22, 2021
Fluidized alignment of a semiconductor die to a test probe
IBM0 citations59
US11561243B2Jan 24, 2023
Compliant organic substrate assembly for rigid probes
IBM0 citations56
US11131689B2Sep 28, 2021
Low-force wafer test probes
IBM0 citations55
US11675010B1Jun 13, 2023
Compliant wafer probe assembly
IBM0 citations52
US11662366B2May 30, 2023
Wafer probe with elastomer support
IBM0 citations52
US10955439B2Mar 23, 2021
Electrochemical cleaning of test probes
IBM0 citations52
US10670653B2Jun 2, 2020
Integrated circuit tester probe contact liner
IBM0 citations51
US8032924B2Oct 4, 2011
Access control method and a system for privacy protection
IBM1 citations51
US12248003B2Mar 11, 2025
Clustered rigid wafer test probe
IBM0 citations50