P

Inventor

HALDER SANDIP

BE11 patents
⚠️ This page may combine multiple inventors who share the name “HALDER SANDIP”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IMEC VZW

6 patents
US10061209B2Aug 28, 2018

Method for verifying a pattern of features printed by a lithography process

IMEC VZW2 citations68
US10732124B2Aug 4, 2020

Methods for detecting defects of a lithographic pattern

IMEC VZW3 citations67
US9983154B2May 29, 2018

Method for inspecting a pattern of features on a semiconductor die

IMEC VZW0 citations46
US12243193B2Mar 4, 2025

Method for de-noising an electron microscope image

IMEC VZW0 citations44
US10818504B2Oct 27, 2020

Method for producing a pattern of features by lithography and etching

IMEC VZW0 citations34
US9874821B2Jan 23, 2018

Method for hotspot detection and ranking of a lithographic mask

IMEC VZW0 citations32

KLA CORP

1 patent
US12066763B2Aug 20, 2024

Sensitivity improvement of optical and SEM defection inspection

KLA CORP0 citations56

MARKWORT LARS

1 patent
US8460946B2Jun 11, 2013

Methods of processing and inspecting semiconductor substrates

MARKWORT LARS1 citations48

SIEMENS IND SOFTWARE INC

1 patent
US12511773B2Dec 30, 2025

Wafer image denoising and contour extraction for manufacturing process calibration

SIEMENS IND SOFTWARE INC0 citations46

BAECKER MICHAEL

1 patent
US8513163B2Aug 20, 2013

Substrate for a superconducting thin-film strip conductor

BAECKER MICHAEL0 citations44

LEUNISSEN LEONARDUS

1 patent
US8735182B2May 27, 2014

Method for detecting embedded voids in a semiconductor substrate

LEUNISSEN LEONARDUS0 citations33