Inventor
KAIZERMAN IDAN
IL26 patents
⚠️ This page may combine multiple inventors who share the name “KAIZERMAN IDAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS ISRAEL LTD
19 patentsUS9286675B1Mar 15, 2016
Iterative defect filtering process
APPLIED MATERIALS ISRAEL LTD23 citations91
US11205119B2Dec 21, 2021
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD11 citations84
US12183066B2Dec 31, 2024
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD1 citations71
US11348001B2May 31, 2022
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD3 citations71
US11010665B2May 18, 2021
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD3 citations71
US10901402B2Jan 26, 2021
Closed-loop automatic defect inspection and classification
APPLIED MATERIALS ISRAEL LTD2 citations71
US10360669B2Jul 23, 2019
System, method and computer program product for generating a training set for a classifier
APPLIED MATERIALS ISRAEL LTD2 citations71
US10190991B2Jan 29, 2019
Method for adaptive sampling in examining an object and system thereof
APPLIED MATERIALS ISRAEL LTD2 citations71
US10161882B1Dec 25, 2018
Method of examining locations in a wafer with adjustable navigation accuracy and system thereof
APPLIED MATERIALS ISRAEL LTD4 citations71
US10114368B2Oct 30, 2018
Closed-loop automatic defect inspection and classification
APPLIED MATERIALS ISRAEL LTD2 citations71
US11526979B2Dec 13, 2022
Method of defect classification and system thereof
APPLIED MATERIALS ISRAEL LTD2 citations70
US10748271B2Aug 18, 2020
Method of defect classification and system thereof
APPLIED MATERIALS ISRAEL LTD4 citations70
US9715724B2Jul 25, 2017
Registration of CAD data with SEM images
APPLIED MATERIALS ISRAEL LTD2 citations69
US10663407B2May 26, 2020
Method of examining locations in a wafer with adjustable navigation accuracy and system thereof
APPLIED MATERIALS ISRAEL LTD0 citations51
US10803575B2Oct 13, 2020
System, method and computer program product for generating a training set for a classifier
APPLIED MATERIALS ISRAEL LTD0 citations50
US10720367B2Jul 21, 2020
Process window analysis
APPLIED MATERIALS ISRAEL LTD0 citations50
US10312161B2Jun 4, 2019
Process window analysis
APPLIED MATERIALS ISRAEL LTD0 citations50
US10049441B2Aug 14, 2018
Iterative defect filtering process
APPLIED MATERIALS ISRAEL LTD0 citations50
US10818000B2Oct 27, 2020
Iterative defect filtering process
APPLIED MATERIALS ISRAEL LTD0 citations45
KAIZERMAN IDAN
3 patentsUS9607233B2Mar 28, 2017
Classifier readiness and maintenance in automatic defect classification
KAIZERMAN IDAN20 citations90
US9858658B2Jan 2, 2018
Defect classification using CAD-based context attributes
KAIZERMAN IDAN9 citations82
US9595091B2Mar 14, 2017
Defect classification using topographical attributes
KAIZERMAN IDAN9 citations82