P

Inventor

KAIZERMAN IDAN

IL26 patents
⚠️ This page may combine multiple inventors who share the name “KAIZERMAN IDAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS ISRAEL LTD

19 patents
US9286675B1Mar 15, 2016

Iterative defect filtering process

APPLIED MATERIALS ISRAEL LTD23 citations91
US11205119B2Dec 21, 2021

Method of deep learning-based examination of a semiconductor specimen and system thereof

APPLIED MATERIALS ISRAEL LTD11 citations84
US12183066B2Dec 31, 2024

Method of deep learning-based examination of a semiconductor specimen and system thereof

APPLIED MATERIALS ISRAEL LTD1 citations71
US11348001B2May 31, 2022

Method of deep learning-based examination of a semiconductor specimen and system thereof

APPLIED MATERIALS ISRAEL LTD3 citations71
US11010665B2May 18, 2021

Method of deep learning-based examination of a semiconductor specimen and system thereof

APPLIED MATERIALS ISRAEL LTD3 citations71
US10901402B2Jan 26, 2021

Closed-loop automatic defect inspection and classification

APPLIED MATERIALS ISRAEL LTD2 citations71
US10360669B2Jul 23, 2019

System, method and computer program product for generating a training set for a classifier

APPLIED MATERIALS ISRAEL LTD2 citations71
US10190991B2Jan 29, 2019

Method for adaptive sampling in examining an object and system thereof

APPLIED MATERIALS ISRAEL LTD2 citations71
US10161882B1Dec 25, 2018

Method of examining locations in a wafer with adjustable navigation accuracy and system thereof

APPLIED MATERIALS ISRAEL LTD4 citations71
US10114368B2Oct 30, 2018

Closed-loop automatic defect inspection and classification

APPLIED MATERIALS ISRAEL LTD2 citations71
US11526979B2Dec 13, 2022

Method of defect classification and system thereof

APPLIED MATERIALS ISRAEL LTD2 citations70
US10748271B2Aug 18, 2020

Method of defect classification and system thereof

APPLIED MATERIALS ISRAEL LTD4 citations70
US9715724B2Jul 25, 2017

Registration of CAD data with SEM images

APPLIED MATERIALS ISRAEL LTD2 citations69
US10663407B2May 26, 2020

Method of examining locations in a wafer with adjustable navigation accuracy and system thereof

APPLIED MATERIALS ISRAEL LTD0 citations51
US10803575B2Oct 13, 2020

System, method and computer program product for generating a training set for a classifier

APPLIED MATERIALS ISRAEL LTD0 citations50
US10720367B2Jul 21, 2020

Process window analysis

APPLIED MATERIALS ISRAEL LTD0 citations50
US10312161B2Jun 4, 2019

Process window analysis

APPLIED MATERIALS ISRAEL LTD0 citations50
US10049441B2Aug 14, 2018

Iterative defect filtering process

APPLIED MATERIALS ISRAEL LTD0 citations50
US10818000B2Oct 27, 2020

Iterative defect filtering process

APPLIED MATERIALS ISRAEL LTD0 citations45

KAIZERMAN IDAN

3 patents

PLAYTIKA LTD

2 patents

GREENBERG GADI

1 patent

SHLAIN VLADIMIR

1 patent