Inventor
HABETS BORIS
DE12 patents
⚠️ This page may combine multiple inventors who share the name “HABETS BORIS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
QONIAC GMBH
7 patentsUS10234401B2Mar 19, 2019
Method of manufacturing semiconductor devices by using sampling plans
QONIAC GMBH8 citations77
US10739688B2Aug 11, 2020
Method and apparatus for fabricating wafer by calculating process correction parameters
QONIAC GMBH1 citations70
US10310490B2Jun 4, 2019
Method and apparatus of evaluating a semiconductor manufacturing process
QONIAC GMBH3 citations67
US10739685B2Aug 11, 2020
Process control method for lithographically processed semiconductor devices
QONIAC GMBH1 citations60
US11366397B2Jun 21, 2022
Method and apparatus for simulation of lithography overlay
QONIAC GMBH0 citations49
US10008422B2Jun 26, 2018
Method for assessing the usability of an exposed and developed semiconductor wafer
QONIAC GMBH1 citations49
US10699971B2Jun 30, 2020
Method for processing of a further layer on a semiconductor wafer
QONIAC GMBH0 citations38
HABETS BORIS
4 patentsUS9543223B2Jan 10, 2017
Method and apparatus for fabricating wafer by calculating process correction parameters
HABETS BORIS5 citations81
US8440475B2May 14, 2013
Alignment calculation
HABETS BORIS7 citations80
US10295914B2May 21, 2019
Method and apparatus for fabricating wafer by calculating process correction parameters
HABETS BORIS1 citations70
US10379447B2Aug 13, 2019
Method and apparatus for simulation of lithography overlay
HABETS BORIS0 citations38