Inventor
OHTA HIROYUKI
JP152 patents
⚠️ This page may combine multiple inventors who share the name “OHTA HIROYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
15 patentsUS6468845B1Oct 22, 2002
Semiconductor apparatus having conductive thin films and manufacturing apparatus therefor
HITACHI LTD80 citations99
US5909052AJun 1, 1999
Semiconductor device having plural chips with the sides of the chips in face-to-face contact with each other in the same crystal plane
HITACHI LTD101 citations97
US5444302AAug 22, 1995
Semiconductor device including multi-layer conductive thin film of polycrystalline material
HITACHI LTD61 citations96
US5229643AJul 20, 1993
Semiconductor apparatus and semiconductor package
HITACHI LTD54 citations96
US6337517B1Jan 8, 2002
Semiconductor device and method of fabricating same
HITACHI LTD21 citations93
US5683515ANov 4, 1997
Apparatus for manufacturing a semiconductor device having conductive then films
HITACHI LTD19 citations93
US8695433B2Apr 15, 2014
Mechanical-quantity measuring device
HITACHI LTD17 citations92
US7992448B2Aug 9, 2011
Mechanical-quantity measuring device
HITACHI LTD22 citations92
US7707894B2May 4, 2010
Apparatus for measuring a mechanical quantity
HITACHI LTD23 citations92
US7293466B2Nov 13, 2007
Bolt with function of measuring strain
HITACHI LTD43 citations92
US7252010B2Aug 7, 2007
Pressure sensor system with semiconductor chip and antenna member
HITACHI LTD21 citations92
US7109568B2Sep 19, 2006
Semiconductor device including n-channel fets and p-channel fets with improved drain current characteristics
HITACHI LTD30 citations92
US6379998B1Apr 30, 2002
Semiconductor device and method for fabricating the same
HITACHI LTD20 citations92
US6566149B1May 20, 2003
Method for manufacturing substrate for inspecting semiconductor device
HITACHI LTD22 citations90
US8365609B2Feb 5, 2013
Mechanical-quantity measuring device
HITACHI LTD7 citations83
FUJITSU LTD
8 patentsUS6268295B1Jul 31, 2001
Method of manufacturing semiconductor device
FUJITSU LTD62 citations94
US6017784AJan 25, 2000
Manufacture method of semiconductor device with suppressed impurity diffusion from gate electrode
FUJITSU LTD53 citations94
US7208812B2Apr 24, 2007
Semiconductor device having STI without divot and its manufacture
FUJITSU LTD36 citations93
US7196396B2Mar 27, 2007
Semiconductor device having STI without divot and its manufacture
FUJITSU LTD22 citations93
US5525551AJun 11, 1996
Method for forming insulating film in semiconductor device using a TEOS or HMDS pre-treatment
FUJITSU LTD41 citations93
US7378305B2May 27, 2008
Semiconductor integrated circuit and fabrication process thereof
FUJITSU LTD27 citations92
US6380014B1Apr 30, 2002
Manufacture method of semiconductor device with suppressed impurity diffusion from gate electrode
FUJITSU LTD40 citations91
US6121113ASep 19, 2000
Method for production of semiconductor device
FUJITSU LTD39 citations87
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
5 patentsUS6268034B1Jul 31, 2001
Optical information recording medium and method for producing the same, method for recording and reproducing information thereon and recording/reproducing apparatus
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD84 citations98
US6821707B2Nov 23, 2004
Optical information recording medium, producing method thereof and method of recording/erasing/reproducing information
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD27 citations92
US6143469ANov 7, 2000
Optical information recording medium and manufacturing method
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD21 citations92
US5914214AJun 22, 1999
Method for manufacturing an optical information recording medium
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD17 citations92
US6933031B2Aug 23, 2005
Optical information recording medium and its manufacturing method
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD18 citations84
RENESAS TECH CORP
4 patentsUS6982465B2Jan 3, 2006
Semiconductor device with CMOS-field-effect transistors having improved drain current characteristics
RENESAS TECH CORP121 citations98
US6686274B1Feb 3, 2004
Semiconductor device having cobalt silicide film in which diffusion of cobalt atoms is inhibited and its production process
RENESAS TECH CORP63 citations96
US6960832B2Nov 1, 2005
Semiconductor device and its production process
RENESAS TECH CORP22 citations92
US7459786B2Dec 2, 2008
Semiconductor device
RENESAS TECH CORP9 citations84
YAMAHA MOTOR CO LTD
4 patentsUS5491888AFeb 20, 1996
Method for mounting component chips and an apparatus therefor
YAMAHA MOTOR CO LTD53 citations96
US5384956AJan 31, 1995
Method for mounting components
YAMAHA MOTOR CO LTD74 citations96
US5377405AJan 3, 1995
Method for mounting components and an apparatus therefor
YAMAHA MOTOR CO LTD103 citations95
US5660519AAug 26, 1997
Method for mounting components and an apparatus therefor
YAMAHA MOTOR CO LTD46 citations92
FUJITSU MICROELECTRONICS LTD
4 patentsUS7579617B2Aug 25, 2009
Semiconductor device and production method thereof
FUJITSU MICROELECTRONICS LTD18 citations92
US7683362B2Mar 23, 2010
Semiconductor device and production method thereof
FUJITSU MICROELECTRONICS LTD13 citations84
US7626215B2Dec 1, 2009
Semiconductor device and method of manufacturing the same
FUJITSU MICROELECTRONICS LTD9 citations84
US7592214B2Sep 22, 2009
Method of manufacturing a semiconductor device including epitaxially growing semiconductor epitaxial layers on a surface of semiconductor substrate
FUJITSU MICROELECTRONICS LTD10 citations84
MITUTOYO CORP
2 patentsELPIDA MEMORY INC
1 patentTAKEDA CHEMICAL INDUSTRIES LTD
1 patentFUJITSU SEMICONDUCTOR LTD
1 patentNIPPON DENSO CO
1 patentSUMIGAWA TAKASHI
1 patentOLYMPUS IMAGING CORP
1 patentOHTA HIROYUKI
1 patentRENESAS ELECTRONICS CORP
1 patentShowing the top 50 of 152 patents by PatentIndex Score.