Inventor
BENNER GERD
DE26 patents
⚠️ This page may combine multiple inventors who share the name “BENNER GERD”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
BENNER GERD
6 patentsUS8476589B2Jul 2, 2013
Particle beam microscope
BENNER GERD5 citations68
US8299442B2Oct 30, 2012
Particle beam apparatus having an annularly-shaped illumination aperture
BENNER GERD2 citations62
US8541739B2Sep 24, 2013
Precession diffraction charged particle beam system
BENNER GERD2 citations60
US8471203B2Jun 25, 2013
Particle-beam microscope
BENNER GERD4 citations59
US8598526B2Dec 3, 2013
Transmission electron microscope
BENNER GERD1 citations51
US8330105B2Dec 11, 2012
Phase contrast electron microscope
BENNER GERD0 citations49
ZEISS CARL MICROSCOPY GMBH
5 patentsUS9349571B2May 24, 2016
Particle optical system
ZEISS CARL MICROSCOPY GMBH33 citations93
US9991089B2Jun 5, 2018
Particle beam system and method for operating a particle optical unit
ZEISS CARL MICROSCOPY GMBH34 citations91
US9799485B2Oct 24, 2017
Particle beam system and method for operating a particle optical unit
ZEISS CARL MICROSCOPY GMBH8 citations80
US9543115B2Jan 10, 2017
Electron microscope
ZEISS CARL MICROSCOPY GMBH2 citations71
US8748819B2Jun 10, 2014
Transmission electron microscopy system and method of operating a transmission electron microscopy system
ZEISS CARL MICROSCOPY GMBH1 citations52
ZEISS STIFTUNG
4 patentsUS5483073AJan 9, 1996
Method of illuminating an object with a focused electron beam and an electron-optical illuminating system therefor
ZEISS STIFTUNG23 citations92
US5013913AMay 7, 1991
Method of illuminating an object in a transmission electron microscope
ZEISS STIFTUNG32 citations92
US5519216AMay 21, 1996
Electron-optical imaging system having controllable elements
ZEISS STIFTUNG22 citations90
US6437353B1Aug 20, 2002
Particle-optical apparatus and process for the particle-optical production of microstructures
ZEISS STIFTUNG17 citations84
ZEISS CARL NTS GMBH
4 patentsUS7741602B2Jun 22, 2010
Phase contrast electron microscope
ZEISS CARL NTS GMBH15 citations90
US7902506B2Mar 8, 2011
Phase-shifting element and particle beam device having a phase-shifting element
ZEISS CARL NTS GMBH10 citations81
US7060978B2Jun 13, 2006
Detector system for a particle beam apparatus, and particle beam apparatus with such a detector system
ZEISS CARL NTS GMBH4 citations60
US8039796B2Oct 18, 2011
Phase contrast electron microscope
ZEISS CARL NTS GMBH0 citations50
LEO ELEKTRONENMIKROSKOPIE GMBH
3 patentsUS6797956B2Sep 28, 2004
Electron microscope with annular illuminating aperture
LEO ELEKTRONENMIKROSKOPIE GMBH26 citations92
US6040576AMar 21, 2000
Energy filter, particularly for an electron microscope
LEO ELEKTRONENMIKROSKOPIE GMBH51 citations92
US6531698B1Mar 11, 2003
Particle-optic illuminating and imaging system with a condenser-objective single field lens
LEO ELEKTRONENMIKROSKOPIE GMBH15 citations84