Inventor
INOUE HIROBUMI
JP13 patents
⚠️ This page may combine multiple inventors who share the name “INOUE HIROBUMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
12 patentsUS6998704B2Feb 14, 2006
Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatus
NEC CORP86 citations97
US6400168B2Jun 4, 2002
Method for fabricating probe tip portion composed by coaxial cable
NEC CORP116 citations96
US6310483B1Oct 30, 2001
Longitudinal type high frequency probe for narrow pitched electrodes
NEC CORP116 citations96
US6281691B1Aug 28, 2001
Tip portion structure of high-frequency probe and method for fabrication probe tip portion composed by coaxial cable
NEC CORP119 citations96
US6242930B1Jun 5, 2001
High-frequency probe capable of adjusting characteristic impedance in end part and having the end part detachable
NEC CORP41 citations91
US7321166B2Jan 22, 2008
Wiring board having connecting wiring between electrode plane and connecting pad
NEC CORP14 citations79
US6486688B2Nov 26, 2002
Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristics
NEC CORP8 citations73
US5614944AMar 25, 1997
Test method and apparatus of sequentially executing synchronous signal test, dot level test, and gradation test of a video signal generator
NEC CORP10 citations73
US6433410B2Aug 13, 2002
Semiconductor device tester and method of testing semiconductor device
NEC CORP6 citations62
US7434190B2Oct 7, 2008
Analysis method and analysis apparatus of designing transmission lines of an integrated circuit packaging board
NEC CORP3 citations61
US6229321B1May 8, 2001
Process for manufacturing high frequency multichip module enabling independent test of bare chip
NEC CORP4 citations61
US7594644B2Sep 29, 2009
Semiconductor device and method for manufacturing the same, circuit board, electronic apparatus, and semiconductor device manufacturing apparatus
NEC CORP0 citations51