Inventor
NAGOYA KOICHI
JP8 patents
⚠️ This page may combine multiple inventors who share the name “NAGOYA KOICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
4 patentsUS7787115B2Aug 31, 2010
Optical apparatus for defect inspection
HITACHI HIGH TECH CORP5 citations71
US7719671B2May 18, 2010
Foreign matter inspection method and foreign matter inspection apparatus
HITACHI HIGH TECH CORP3 citations62
US9964500B2May 8, 2018
Defect inspection device, display device, and defect classification device
HITACHI HIGH TECH CORP0 citations51
US7986405B2Jul 26, 2011
Foreign matter inspection method and foreign matter inspection apparatus
HITACHI HIGH TECH CORP0 citations51