Inventor

SHIN HONG-JAE

KR61 patents

⚠️ This page may combine multiple inventors who share the name “SHIN HONG-JAE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SHIN HONG-JAE

SAMSUNG ELECTRONICS CO LTD

Semiconductor device having improved metal line structure and manufacturing method therefor

Interlayered dielectric layer of semiconductor device and method of manufacturing the same

Method of fabricating dual damascene interconnections of microelectronic device using hybrid low k-dielectric and carbon-free inorganic filler

Method for forming metal wiring layer of semiconductor device

Method of manufacturing interconnection line in semiconductor device

Multi-layered dielectric layer including insulating layer having Si-CH3 bond therein and method for fabricating the same

Semiconductor device having improved metal line structure and manufacturing method therefor

Methods of manufacturing integrated circuit devices in which a spin on glass insulation layer is dissolved so as to recess the spin on glass insulation layer from the upper surface of a pattern

Method for metalization by dual damascene process using photosensitive polymer

Method for forming conductive line of semiconductor device

Semiconductor device having crack stop structure

Method for forming metal wiring layer of semiconductor device

Method of planarization using selecting curing of SOG layer

Method of forming a metal wiring by a dual damascene process using a photosensitive polymer

Semiconductor device and methods of forming the same

Methods of producing semiconductor devices including multiple stress films in interface area

Methods of manufacturing semiconductor devices

Method for fabricating semiconductor device that includes forming passivation film along side wall of via hole

Method of fabricating dual damascene interconnections of microelectronic device using diffusion barrier layer against base material

Electrical fuse device

Methods of fabricating a semiconductor device using a cyclic selective epitaxial growth technique and semiconductor devices formed using the same

Method of fabricating semiconductor devices having low dielectric interlayer insulation layer

Methods of forming integrated circuit devices having tensile and compressive stress layers therein and devices formed thereby

Semiconductor device and method of fabricating the same

Charge pump, DC-DC converter, and method thereof

Semiconductor device free of gate spacer stress and method of manufacturing the same

Method for forming interconnection line in semiconductor device and interconnection line structure

Method of forming interconnection lines for semiconductor device

Method of fabricating semiconductor device

Method of manufacturing semiconductor device

Methods of forming insulation layer patterns and methods of manufacturing semiconductor devices including insulation layer patterns

Semiconductor device having low-k dielectric film in pad region and method for manufacture thereof

Semiconductor device having low-k dielectric film in pad region

LG DISPLAY CO LTD

Display device including gate driving circuit and link line

Gate driving circuit and display device including the same

Gate driving circuit and display device including the same

Thin film transistor substrate having a thin film transistor having multiple top gates and organic light emitting device using the same

KIM JIN-HO

Driving circuit of liquid crystal display

Driving circuit of liquid crystal display

SHIN HONG-JAE

Gate shift register

Gate driving unit for liquid crystal display device and method of repairing the same

SHIN DONG-SUK

Electrical fuse device

Electrical fuse device

SONY CORP

Method of removing resist, semiconductor device thereby and method of manufacturing a semiconductor device

HANA MICRON INC

Organic light emitting diode display device driving apparatus and driving method thereof

KIM TAE-WHAN

Driving current output apparatus, method of manufacturing the same, display device and driving apparatus thereof

LEE KYOUNG-WOO

Monitoring test element groups (TEGs) for etching process and methods of manufacturing a semiconductor device using the same

SAMUNG ELECTRONICS CO LTD

Method of forming a metal interconnection of a semiconductor device, and metal interconnection formed by such method

LEE SUN-JUNG

Test apparatus for determining if adjacent contacts are short-circuited and semiconductor integrated circuit devices that include such test apparatus

CHANG CHONG-KWANG

Method of fabricating semiconductor integrated circuit device