Inventor
PARKER JOHN D
US14 patents
⚠️ This page may combine multiple inventors who share the name “PARKER JOHN D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
6 patentsUS10209306B2Feb 19, 2019
Methods and systems for generating functional test patterns for manufacture test
IBM1 citations73
US9857422B2Jan 2, 2018
Methods and systems for generating functional test patterns for manufacture test
IBM2 citations73
US10365132B2Jul 30, 2019
Methods and systems for performing test and calibration of integrated sensors
IBM2 citations72
US10203371B2Feb 12, 2019
Methods and systems for generating functional test patterns for manufacture test
IBM0 citations52
US10598526B2Mar 24, 2020
Methods and systems for performing test and calibration of integrated sensors
IBM0 citations51
US10571519B2Feb 25, 2020
Performing system functional test on a chip having partial-good portions
IBM0 citations40