P

Inventor

MINAMIHABA GAKU

JP63 patents
⚠️ This page may combine multiple inventors who share the name “MINAMIHABA GAKU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOSHIBA KK

46 patents
US6740590B1May 25, 2004

Aqueous dispersion, aqueous dispersion for chemical mechanical polishing used for manufacture of semiconductor devices, method for manufacture of semiconductor devices, and method for formation of embedded writing

TOSHIBA KK102 citations98
US6454819B1Sep 24, 2002

Composite particles and production process thereof, aqueous dispersion, aqueous dispersion composition for chemical mechanical polishing, and process for manufacture of semiconductor device

TOSHIBA KK108 citations98
US6375545B1Apr 23, 2002

Chemical mechanical method of polishing wafer surfaces

TOSHIBA KK131 citations98
US5592024AJan 7, 1997

Semiconductor device having a wiring layer with a barrier layer

TOSHIBA KK133 citations98
US6794286B2Sep 21, 2004

Process for fabricating a metal wiring and metal contact in a semicondutor device

TOSHIBA KK55 citations96
US7166017B2Jan 23, 2007

Slurry for CMP, polishing method and method of manufacturing semiconductor device

TOSHIBA KK23 citations93
US6858539B2Feb 22, 2005

Post-CMP treating liquid and method for manufacturing semiconductor device

TOSHIBA KK24 citations93
US6794285B2Sep 21, 2004

Slurry for CMP, and method of manufacturing semiconductor device

TOSHIBA KK19 citations93
US6611060B1Aug 26, 2003

Semiconductor device having a damascene type wiring layer

TOSHIBA KK26 citations93
US7042099B2May 9, 2006

Semiconductor device containing a dummy wire

TOSHIBA KK35 citations92
US6935928B2Aug 30, 2005

Chemical mechanical polishing aqueous dispersion and chemical mechanical polishing method

TOSHIBA KK24 citations92
US6858936B2Feb 22, 2005

Semiconductor device having an improved construction in the interlayer insulating film

TOSHIBA KK15 citations92
US6576554B2Jun 10, 2003

Slurry for CMP, method of forming thereof and method of manufacturing semiconductor device including a CMP process

TOSHIBA KK25 citations92
US6312321B1Nov 6, 2001

Polishing apparatus

TOSHIBA KK22 citations92
US6090699AJul 18, 2000

Method of making a semiconductor device

TOSHIBA KK35 citations92
US7419910B2Sep 2, 2008

Slurry for CMP, polishing method and method of manufacturing semiconductor device

TOSHIBA KK12 citations84
US7332104B2Feb 19, 2008

Slurry for CMP, polishing method and method of manufacturing semiconductor device

TOSHIBA KK15 citations84
US7307344B2Dec 11, 2007

Semiconductor device including a discontinuous film and method for manufacturing the same

TOSHIBA KK17 citations84
US7071108B2Jul 4, 2006

Chemical mechanical polishing slurry containing abrasive particles exhibiting photocatalytic function

TOSHIBA KK15 citations84
US6653267B2Nov 25, 2003

Aqueous dispersion for chemical mechanical polishing used for polishing of copper

TOSHIBA KK13 citations84
US7842191B2Nov 30, 2010

CMP slurry for metallic film, polishing method and method of manufacturing semiconductor device

TOSHIBA KK7 citations74
US7402521B2Jul 22, 2008

Method for chemically mechanically polishing organic film, method of manufacturing semiconductor device, and program therefor

TOSHIBA KK8 citations74
US7364667B2Apr 29, 2008

Slurry for CMP and CMP method

TOSHIBA KK5 citations74
US7144804B2Dec 5, 2006

Semiconductor device and method of manufacturing the same

TOSHIBA KK6 citations74
US7138073B2Nov 21, 2006

Slurry for chemical mechanical polishing for copper and method of manufacturing semiconductor device using the slurry

TOSHIBA KK7 citations74
US7060621B2Jun 13, 2006

Slurry for CMP, polishing method and method of manufacturing semiconductor device

TOSHIBA KK8 citations74
US6995090B2Feb 7, 2006

Polishing slurry for use in CMP of SiC series compound, polishing method, and method of manufacturing semiconductor device

TOSHIBA KK6 citations74
US6896590B2May 24, 2005

CMP slurry and method for manufacturing a semiconductor device

TOSHIBA KK9 citations74
US6790769B2Sep 14, 2004

CMP slurry and method of manufacturing semiconductor device

TOSHIBA KK6 citations74
US6720250B2Apr 13, 2004

Method of manufacturing a semiconductor device using a slurry for chemical mechanical polishing of copper

TOSHIBA KK7 citations74
US6444139B1Sep 3, 2002

Slurry for CMP and CMP method

TOSHIBA KK13 citations74
US8871644B2Oct 28, 2014

Method of manufacturing semiconductor device

TOSHIBA KK4 citations73
US7435682B2Oct 14, 2008

Method of manufacturing semiconductor device

TOSHIBA KK8 citations72
US7833431B2Nov 16, 2010

Aqueous dispersion for CMP, polishing method and method for manufacturing semiconductor device

TOSHIBA KK3 citations63
US7700489B2Apr 20, 2010

Method of manufacturing a semiconductor device

TOSHIBA KK4 citations63
US7655559B2Feb 2, 2010

Post-CMP treating liquid and manufacturing method of semiconductor device using the same

TOSHIBA KK5 citations63
US7521350B2Apr 21, 2009

Manufacturing method of a semiconductor device

TOSHIBA KK4 citations63
US7465668B2Dec 16, 2008

Method of manufacturing semiconductor device

TOSHIBA KK3 citations63
US7459398B2Dec 2, 2008

Slurry for CMP, polishing method and method of manufacturing semiconductor device

TOSHIBA KK6 citations63
US7452819B2Nov 18, 2008

Chemical mechanical polishing method of organic film and method of manufacturing semiconductor device

TOSHIBA KK3 citations63
US7307023B2Dec 11, 2007

Polishing method of Cu film and method for manufacturing semiconductor device

TOSHIBA KK2 citations63
US6984582B2Jan 10, 2006

Method of making semiconductor device by polishing with intermediate clean polishing

TOSHIBA KK5 citations63
US6945854B2Sep 20, 2005

Semiconductor device fabrication method and apparatus

TOSHIBA KK3 citations63
US6897143B2May 24, 2005

Method of manufacturing semiconductor device including two-step polishing operation for cap metal

TOSHIBA KK3 citations63
US7354861B1Apr 8, 2008

Polishing method and polishing liquid

TOSHIBA KK3 citations62
US9144879B2Sep 29, 2015

Planarization method and planarization apparatus

TOSHIBA KK3 citations61

JSR CORP

1 patent

FUKUSHIMA DAI

1 patent

MINAMIHABA GAKU

1 patent

MATSUI YUKITERU

1 patent

Showing the top 50 of 63 patents by PatentIndex Score.