Inventor
COHEN YOEL
IL35 patents
⚠️ This page may combine multiple inventors who share the name “COHEN YOEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NOVA MEASURING INSTR LTD
17 patentsUS6704920B2Mar 9, 2004
Process control for micro-lithography
NOVA MEASURING INSTR LTD101 citations98
US6166801ADec 26, 2000
Monitoring apparatus and method particularly useful in photolithographically processing substrates
NOVA MEASURING INSTR LTD154 citations98
US6424417B1Jul 23, 2002
Method and system for controlling the photolithography process
NOVA MEASURING INSTR LTD68 citations96
US6842220B1Jan 11, 2005
Monitoring apparatus and method particularly useful in photolithographically processing substrates
NOVA MEASURING INSTR LTD24 citations95
US7030957B2Apr 18, 2006
Monitoring apparatus and method particularly useful in photolithographically processing substrates
NOVA MEASURING INSTR LTD13 citations92
US6643017B2Nov 4, 2003
Method and system for controlling the photolithography process
NOVA MEASURING INSTR LTD22 citations92
US7327476B2Feb 5, 2008
Thin films measurement method and system
NOVA MEASURING INSTR LTD12 citations91
US9291911B2Mar 22, 2016
Monitoring apparatus and method particularly useful in photolithographically processing substrates
NOVA MEASURING INSTR LTD3 citations83
US7289190B2Oct 30, 2007
Monitoring apparatus and method particularly useful in photolithographically
NOVA MEASURING INSTR LTD9 citations81
US7525634B2Apr 28, 2009
Monitoring apparatus and method particularly useful in photolithographically
NOVA MEASURING INSTR LTD4 citations73
US7595896B2Sep 29, 2009
Thin films measurement method and system
NOVA MEASURING INSTR LTD5 citations72
US8964178B2Feb 24, 2015
Method and system for use in monitoring properties of patterned structures
NOVA MEASURING INSTR LTD1 citations63
US6720568B2Apr 13, 2004
Method and system for optical inspection of a structure formed with a surface relief
NOVA MEASURING INSTR LTD4 citations63
US8040532B2Oct 18, 2011
Thin films measurement method and system
NOVA MEASURING INSTR LTD2 citations61
US8643842B2Feb 4, 2014
Method and system for use in monitoring properties of patterned structures
NOVA MEASURING INSTR LTD0 citations52
US8780320B2Jul 15, 2014
Monitoring apparatus and method particularly useful in photolithographically processing substrates
NOVA MEASURING INSTR LTD0 citations51
US7821614B2Oct 26, 2010
Monitoring apparatus and method particularly useful in photolithographically processing substrates
NOVA MEASURING INSTR LTD0 citations51
ADOM ADVANCED OPTICAL TECH LTD
15 patentsUS9757027B2Sep 12, 2017
System and method for performing tear film structure measurement and evaporation rate measurements
ADOM ADVANCED OPTICAL TECH LTD6 citations82
US10054419B2Aug 21, 2018
Method for analyzing an object using a combination of long and short coherence interferometry
ADOM ADVANCED OPTICAL TECH LTD2 citations73
US10024650B2Jul 17, 2018
System for analyzing optical properties of an object
ADOM ADVANCED OPTICAL TECH LTD4 citations73
US10456029B2Oct 29, 2019
Apparatus and method for detecting surface topography
ADOM ADVANCED OPTICAL TECH LTD2 citations71
US9833139B1Dec 5, 2017
System and method for performing tear film structure measurement
ADOM ADVANCED OPTICAL TECH LTD3 citations71
US10612913B2Apr 7, 2020
Apparatus and methods for performing tomography and/or topography measurements on an object
ADOM ADVANCED OPTICAL TECH LTD1 citations62
US11116394B2Sep 14, 2021
System and method for performing tear film structure measurement
ADOM ADVANCED OPTICAL TECH LTD0 citations60
US10415954B2Sep 17, 2019
Method for analyzing an object
ADOM ADVANCED OPTICAL TECH LTD0 citations52
US10330462B2Jun 25, 2019
System for analyzing optical properties of an object
ADOM ADVANCED OPTICAL TECH LTD0 citations52
US10119903B2Nov 6, 2018
Interferometric ellipsometry and method using conical refraction
ADOM ADVANCED OPTICAL TECH LTD0 citations52
US10054429B2Aug 21, 2018
System for tomography and/or topography measurements of a layered objects
ADOM ADVANCED OPTICAL TECH LTD0 citations52
US10024783B2Jul 17, 2018
Interferometric ellipsometry and method using conical refraction
ADOM ADVANCED OPTICAL TECH LTD1 citations52
US12023099B2Jul 2, 2024
System and method for performing tear film structure measurement
ADOM ADVANCED OPTICAL TECH LTD0 citations50
US11965777B2Apr 23, 2024
Apparatus and methods for calibrating optical measurements
ADOM ADVANCED OPTICAL TECH LTD0 citations50
US12213733B2Feb 4, 2025
System and method for detecting physical characteristics of a multilayered tissue of a subject
ADOM ADVANCED OPTICAL TECH LTD0 citations43