Inventor · disambiguated record
Ayato Tagawa
Also filed as: TAGAWA AYATO
7 granted patents·5 pending applications·8 citations·filing 2014–2023
73Inventor score
Files withSYSMEX CORP12
Top patents by PatentIndex Score
12 records- 0188US10173217B2Sample processing method, sample processing chip, and sample processing apparatusSYSMEX CORP·Filed 2017·Granted Jan 8, 2019·6 cites·20 claims
- 0278US10620108B2Method of processing specimen and specimen processing apparatusSYSMEX CORP·Filed 2017·Granted Apr 14, 2020·2 cites·20 claims
- 0365US2024142789A1Optical system and specimen analyzerSYSMEX CORP·Filed 2023·Application pending·0 cites
- 0454US9885661B2Analyte detection method, fluorescence detection method, and fluorescence detection apparatus using sameSYSMEX CORP·Filed 2014·Granted Feb 6, 2018·0 cites·18 claims
- 0548US12403473B2Particle sorter, particle sorting method, and micro flow path cartridgeSYSMEX CORP·Filed 2021·Granted Sep 2, 2025·0 cites·14 claims
- 0645US11389803B2Liquid sending method and liquid sending apparatusSYSMEX CORP·Filed 2018·Granted Jul 19, 2022·0 cites·13 claims
- 0745US11285077B2Blood collection device, blood collection set, blood collection methodSYSMEX CORP·Filed 2017·Granted Mar 29, 2022·0 cites·19 claims
- 0842US2019285520A1Sample processing method, sample processing chip and sample processing apparatusSYSMEX CORP·Filed 2019·Application pending·0 cites
- 0941US11325120B2Specimen treatment chip, specimen treatment apparatus, and specimen treatment methodSYSMEX CORP·Filed 2018·Granted May 10, 2022·0 cites·21 claims
- 1041US2018221881A1Specimen treatment chip, specimen treatment apparatus, and specimen treatment methodSYSMEX CORP·Filed 2018·Application pending·0 cites
- 1140US2018149566A1Specimen treatment apparatus, specimen treatment method, and specimen treatment chipSYSMEX CORP·Filed 2017·Application pending·0 cites
- 1234US2016061730A1Fluorescence detection apparatus, test substance detection apparatus, and fluorescence detection methodSYSMEX CORP·Filed 2015·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →