P

Inventor

ELLIS WAYNE F

US56 patents
⚠️ This page may combine multiple inventors who share the name “ELLIS WAYNE F”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

31 patents
US6358627B2Mar 19, 2002

Rolling ball connector

IBM164 citations99
US5334880AAug 2, 1994

Low voltage programmable storage element

IBM124 citations99
US6233184B1May 15, 2001

Structures for wafer level test and burn-in

IBM102 citations98
US6177729B1Jan 23, 2001

Rolling ball connector

IBM84 citations98
US6373771B1Apr 16, 2002

Integrated fuse latch and shift register for efficient programming and fuse readout

IBM104 citations97
US5446695AAug 29, 1995

Memory device with programmable self-refreshing and testing methods therefore

IBM119 citations97
US7480774B2Jan 20, 2009

Method for performing a command cancel function in a DRAM

IBM99 citations96
US6646949B1Nov 11, 2003

Word line driver for dynamic random access memories

IBM64 citations96
US6507237B2Jan 14, 2003

Low-power DC voltage generator system

IBM44 citations96
US6337595B1Jan 8, 2002

Low-power DC voltage generator system

IBM52 citations96
US5418738AMay 23, 1995

Low voltage programmable storage element

IBM53 citations96
US7193262B2Mar 20, 2007

Low-cost deep trench decoupling capacitor device and process of manufacture

IBM26 citations93
US7132841B1Nov 7, 2006

Carrier for test, burn-in, and first level packaging

IBM37 citations93
US7085971B2Aug 1, 2006

ECC based system and method for repairing failed memory elements

IBM30 citations93
US7313032B2Dec 25, 2007

SRAM voltage control for improved operational margins

IBM21 citations92
US6737907B2May 18, 2004

Programmable DC voltage generator system

IBM29 citations92
US6426904B2Jul 30, 2002

Structures for wafer level test and burn-in

IBM43 citations92
US6252806B1Jun 26, 2001

Multi-generator, partial array Vt tracking system to improve array retention time

IBM21 citations92
US5265056ANov 23, 1993

Signal margin testing system for dynamic RAM

IBM35 citations92
US5157635AOct 20, 1992

Input signal redriver for semiconductor modules

IBM48 citations92
US4992984AFeb 12, 1991

Memory module utilizing partially defective memory chips

IBM44 citations92
US6826113B2Nov 30, 2004

Synchronous dynamic random access memory device having memory command cancel function

IBM47 citations91
US7394268B2Jul 1, 2008

Carrier for test, burn-in, and first level packaging

IBM13 citations84
US6912665B2Jun 28, 2005

Automatic timing analyzer

IBM17 citations84
US6538932B2Mar 25, 2003

Timing circuit and method for a compilable DRAM

IBM15 citations84
US6452855B1Sep 17, 2002

DRAM array interchangeable between single-cell and twin-cell array operation

IBM16 citations84
US4542310ASep 17, 1985

CMOS bootstrapped pull up circuit

IBM24 citations82
US6580650B2Jun 17, 2003

DRAM word line voltage control to insure full cell writeback level

IBM10 citations74
US6121106ASep 19, 2000

Method for forming an integrated trench capacitor

IBM10 citations74
US5559050ASep 24, 1996

P-MOSFETS with enhanced anomalous narrow channel effect

IBM13 citations74
US5463335AOct 31, 1995

Power up detection circuits

IBM11 citations72

RAMBUS INC

16 patents

ELLIS WAYNE F

2 patents

FRANS YOHAN U

1 patent

Showing the top 50 of 56 patents by PatentIndex Score.