P

Inventor

POLO ALESSANDRO

BE17 patents

Patents

17 patents
US10845304B2Nov 24, 2020

Scatterometer and method of scatterometry using acoustic radiation

ASML NETHERLANDS BV2 citations72
US10788766B2Sep 29, 2020

Metrology sensor, lithographic apparatus and method for manufacturing devices

ASML NETHERLANDS BV4 citations72
US10678145B2Jun 9, 2020

Radiation receiving system

ASML NETHERLANDS BV2 citations72
US10317808B2Jun 11, 2019

Position sensing arrangement and lithographic apparatus including such an arrangement, position sensing method and device manufacturing method

ASML NETHERLANDS BV3 citations72
US10585363B2Mar 10, 2020

Alignment system

ASML NETHERLANDS BV4 citations70
US11086240B2Aug 10, 2021

Metrology sensor, lithographic apparatus and method for manufacturing devices

ASML NETHERLANDS BV2 citations68
US10466601B2Nov 5, 2019

Alignment sensor for lithographic apparatus

ASML NETHERLANDS BV5 citations68
US11927891B2Mar 12, 2024

Apparatus and methods for determining the position of a target structure on a substrate

ASML NETHERLANDS BV0 citations62
US11536654B2Dec 27, 2022

Scatterometer and method of scatterometry using acoustic radiation

ASML NETHERLANDS BV0 citations62
US11333985B2May 17, 2022

Position sensor

ASML NETHERLANDS BV0 citations62
US10444638B2Oct 15, 2019

Method for parameter determination and apparatus thereof

ASML NETHERLANDS BV1 citations62
US11761929B2Sep 19, 2023

Sensor apparatus for lithographic measurements

ASML NETHERLANDS BV0 citations61
US11428925B2Aug 30, 2022

Position metrology apparatus and associated optical elements

ASML NETHERLANDS BV0 citations61
US11300892B2Apr 12, 2022

Sensor apparatus and method for lithographic measurements

ASML NETHERLANDS BV0 citations61
US11099489B2Aug 24, 2021

Method of measuring a parameter of a lithographic process, metrology apparatus

ASML NETHERLANDS BV0 citations61
US10101675B2Oct 16, 2018

Metrology apparatus, method of measuring a structure and lithographic apparatus

ASML NETHERLANDS BV1 citations51
US10527959B2Jan 7, 2020

Position sensor, lithographic apparatus and method for manufacturing devices

ASML NETHERLANDS BV0 citations41