Inventor

TACHIZAKI TAKEHIRO

JP11 patents

⚠️ This page may combine multiple inventors who share the name “TACHIZAKI TAKEHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI HIGH TECH CORP

5 patents

US10267745B2Apr 23, 2019

Defect detection method and defect detection device and defect observation device provided with same

HITACHI HIGH TECH CORP7 citations83

US8359661B2Jan 22, 2013

Magnetic device inspection apparatus and magnetic device inspection method

HITACHI HIGH TECH CORP10 citations83

US9759666B2Sep 12, 2017

Defect detection method and defect detection device and defect observation device provided with same

HITACHI HIGH TECH CORP1 citations62

US9217718B2Dec 22, 2015

Defect detection method and defect detection device and defect observation device provided with same

HITACHI HIGH TECH CORP0 citations51

US8787134B2Jul 22, 2014

Thermally assisted magnetic recording head inspection method and apparatus

HITACHI HIGH TECH CORP0 citations51

TACHIZAKI TAKEHIRO

2 patents

US8982332B2Mar 17, 2015

Distance measuring device and distance measuring method

TACHIZAKI TAKEHIRO2 citations57

US9063168B2Jun 23, 2015

Scanning probe microscope and measurement method using same

TACHIZAKI TAKEHIRO0 citations47

OTANI YUKO

1 patent

US8953156B2Feb 10, 2015

Defect detection method and defect detection device and defect observation device provided with same

OTANI YUKO1 citations59

NAKATA TOSHIHIKO

1 patent

US9134279B2Sep 15, 2015

Internal defect inspection method and apparatus for the same

NAKATA TOSHIHIKO0 citations51

WATANABE MASAHIRO

1 patent

US8656509B2Feb 18, 2014

Scanning probe microscope and surface shape measuring method using same

WATANABE MASAHIRO1 citations51

ZHANG KAIFENG

1 patent

US8483035B2Jul 9, 2013

Thermally assisted magnetic recording head inspection method and apparatus

ZHANG KAIFENG1 citations46