Inventor
RAMAPPA DEEPAK A
US29 patents
⚠️ This page may combine multiple inventors who share the name “RAMAPPA DEEPAK A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
12 patentsUS7443189B2Oct 28, 2008
Method to detect and predict metal silicide defects in a microelectronic device during the manufacture of an integrated circuit
TEXAS INSTRUMENTS INC83 citations98
US7772867B2Aug 10, 2010
Structures for testing and locating defects in integrated circuits
TEXAS INSTRUMENTS INC13 citations84
US7601629B2Oct 13, 2009
Semiconductive device fabricated using subliming materials to form interlevel dielectrics
TEXAS INSTRUMENTS INC8 citations81
US7200498B2Apr 3, 2007
System for remediating cross contamination in semiconductor manufacturing processes
TEXAS INSTRUMENTS INC7 citations74
US6812050B1Nov 2, 2004
System and method of evaluating gate oxide integrity for semiconductor microchips
TEXAS INSTRUMENTS INC12 citations74
US7268073B2Sep 11, 2007
Post-polish treatment for inhibiting copper corrosion
TEXAS INSTRUMENTS INC9 citations71
US6963206B2Nov 8, 2005
System and method of evaluating gate oxide integrity for semiconductor microchips
TEXAS INSTRUMENTS INC2 citations63
US7228193B2Jun 5, 2007
Methods for detecting structure dependent process defects
TEXAS INSTRUMENTS INC6 citations61
US7910477B2Mar 22, 2011
Etch residue reduction by ash methodology
TEXAS INSTRUMENTS INC2 citations58
US7312151B2Dec 25, 2007
System for ultraviolet atmospheric seed layer remediation
TEXAS INSTRUMENTS INC2 citations58
US7745238B2Jun 29, 2010
Monitoring of temperature variation across wafers during processing
TEXAS INSTRUMENTS INC3 citations56
US7015568B2Mar 21, 2006
System for ultraviolet atmospheric seed layer remediation
TEXAS INSTRUMENTS INC1 citations47
RAMAPPA DEEPAK A
6 patentsUS8507298B2Aug 13, 2013
Patterned implant of a dielectric layer
RAMAPPA DEEPAK A6 citations72
US8187979B2May 29, 2012
Workpiece patterning with plasma sheath modulation
RAMAPPA DEEPAK A4 citations62
US8716155B2May 6, 2014
Method to enhance charge trapping
RAMAPPA DEEPAK A2 citations61
US8592230B2Nov 26, 2013
Method for patterning a substrate using ion assisted selective depostion
RAMAPPA DEEPAK A1 citations51
US8466039B2Jun 18, 2013
Pressurized treatment of substrates to enhance cleaving process
RAMAPPA DEEPAK A0 citations51
US8183546B2May 22, 2012
Ion implantation through laser fields
RAMAPPA DEEPAK A0 citations51
VARIAN SEMICONDUCTOR EQUIPMENT
4 patentsUS8937004B2Jan 20, 2015
Apparatus and method for controllably implanting workpieces
VARIAN SEMICONDUCTOR EQUIPMENT5 citations84
US7868306B2Jan 11, 2011
Thermal modulation of implant process
VARIAN SEMICONDUCTOR EQUIPMENT8 citations84
US7902091B2Mar 8, 2011
Cleaving of substrates
VARIAN SEMICONDUCTOR EQUIPMENT4 citations63
US9293623B2Mar 22, 2016
Techniques for manufacturing devices
VARIAN SEMICONDUCTOR EQUIPMENT0 citations52
AGERE SYSTEMS INC
3 patentsUS6607927B2Aug 19, 2003
Method and apparatus for monitoring in-line copper contamination
AGERE SYSTEMS INC42 citations89
US6869873B2Mar 22, 2005
Copper silicide passivation for improved reliability
AGERE SYSTEMS INC26 citations88
US6573183B2Jun 3, 2003
Method and apparatus for controlling contamination during the electroplating deposition of metals onto a semiconductor wafer surface
AGERE SYSTEMS INC0 citations52