P

Inventor

SARDESAI VIRAJ Y

US41 patents
⚠️ This page may combine multiple inventors who share the name “SARDESAI VIRAJ Y”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

32 patents
US6268299B1Jul 31, 2001

Variable stoichiometry silicon nitride barrier films for tunable etch selectivity and enhanced hyrogen permeability

IBM78 citations96
US6117778ASep 12, 2000

Semiconductor wafer edge bead removal method and tool

IBM60 citations95
US9496362B1Nov 15, 2016

Contact first replacement metal gate

IBM20 citations93
US9111962B1Aug 18, 2015

Selective dielectric spacer deposition for exposing sidewalls of a finFET

IBM18 citations92
US8643122B2Feb 4, 2014

Silicide contacts having different shapes on regions of a semiconductor device

IBM26 citations92
US8603881B1Dec 10, 2013

Raised trench metal semiconductor alloy formation

IBM19 citations92
US6497784B1Dec 24, 2002

Semiconductor wafer edge bead removal method and tool

IBM20 citations92
US6057220AMay 2, 2000

Titanium polycide stabilization with a porous barrier

IBM36 citations92
US9349836B2May 24, 2016

Fin end spacer for preventing merger of raised active regions

IBM6 citations84
US9105614B2Aug 11, 2015

Local interconnects compatible with replacement gate structures

IBM6 citations84
US8815693B2Aug 26, 2014

FinFET device formation

IBM13 citations84
US8796099B2Aug 5, 2014

Inducing channel strain via encapsulated silicide formation

IBM7 citations84
US10262996B2Apr 16, 2019

Third type of metal gate stack for CMOS devices

IBM1 citations73
US9985104B2May 29, 2018

Contact first replacement metal gate

IBM2 citations73
US9263457B2Feb 16, 2016

Cross-coupling of gate conductor line and active region in semiconductor devices

IBM4 citations73
US9059290B2Jun 16, 2015

FinFET device formation

IBM4 citations73
US9496368B2Nov 15, 2016

Partial spacer for increasing self aligned contact process margins

IBM2 citations63
US9331166B2May 3, 2016

Selective dielectric spacer deposition for exposing sidewalls of a finFET

IBM2 citations62
US10741554B2Aug 11, 2020

Third type of metal gate stack for CMOS devices

IBM0 citations52
US10083865B2Sep 25, 2018

Partial spacer for increasing self aligned contact process margins

IBM0 citations52
US9929047B2Mar 27, 2018

Partial spacer for increasing self aligned contact process margins

IBM0 citations52
US9679993B2Jun 13, 2017

Fin end spacer for preventing merger of raised active regions

IBM0 citations52
US9634006B2Apr 25, 2017

Third type of metal gate stack for CMOS devices

IBM0 citations52
US9601380B2Mar 21, 2017

Fin end spacer for preventing merger of raised active regions

IBM0 citations52
US9553157B2Jan 24, 2017

Diffusion-controlled oxygen depletion of semiconductor contact interface

IBM0 citations52
US9515168B2Dec 6, 2016

Fin end spacer for preventing merger of raised active regions

IBM0 citations52
US9397181B2Jul 19, 2016

Diffusion-controlled oxygen depletion of semiconductor contact interface

IBM1 citations52
US9391175B2Jul 12, 2016

Fin end spacer for preventing merger of raised active regions

IBM0 citations52
US9318323B2Apr 19, 2016

Semiconductor devices with graphene nanoribbons

IBM0 citations52
US9171800B2Oct 27, 2015

Electrical fuse with bottom contacts

IBM0 citations52
US8039888B2Oct 18, 2011

Conductive spacers for semiconductor devices and methods of forming

IBM0 citations51
US9472415B2Oct 18, 2016

Directional chemical oxide etch technique

IBM0 citations42

SARDESAI VIRAJ Y

2 patents

ALPTEKIN EMRE

2 patents

GLOBALFOUNDRIES INC

1 patent

ENGEL BRETT H

1 patent

TOSHIBA KK

1 patent

GLOBAL FOUNDRIES U S 2 LLC

1 patent

INFINEON TECHNOLOGIES AG

1 patent