Inventor
VEGA REINALDO A
US86 patents
⚠️ This page may combine multiple inventors who share the name “VEGA REINALDO A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
41 patentsUS9530700B1Dec 27, 2016
Method of fabricating vertical field effect transistors with protective fin liner during bottom spacer recess etch
IBM65 citations98
US9437503B1Sep 6, 2016
Vertical FETs with variable bottom spacer recess
IBM73 citations98
US9859421B1Jan 2, 2018
Vertical field effect transistor with subway etch replacement metal gate
IBM25 citations94
US9761727B2Sep 12, 2017
Vertical FETs with variable bottom spacer recess
IBM12 citations92
US9111962B1Aug 18, 2015
Selective dielectric spacer deposition for exposing sidewalls of a finFET
IBM18 citations92
US8643122B2Feb 4, 2014
Silicide contacts having different shapes on regions of a semiconductor device
IBM26 citations92
US10283416B2May 7, 2019
Vertical FETS with variable bottom spacer recess
IBM4 citations84
US10249739B2Apr 2, 2019
Nanosheet MOSFET with partial release and source/drain epitaxy
IBM9 citations84
US10236344B2Mar 19, 2019
Tunnel transistors with abrupt junctions
IBM7 citations84
US10170584B2Jan 1, 2019
Nanosheet field effect transistors with partial inside spacers
IBM11 citations84
US10109535B2Oct 23, 2018
Method of fabricating vertical field effect transistors with protective fin liner during bottom spacer recess ETCH
IBM6 citations84
US9911804B1Mar 6, 2018
Vertical fin field effect transistor with air gap spacers
IBM8 citations84
US9601491B1Mar 21, 2017
Vertical field effect transistors having epitaxial fin channel with spacers below gate structure
IBM10 citations84
US9466693B1Oct 11, 2016
Self aligned replacement metal source/drain finFET
IBM5 citations84
US9431395B2Aug 30, 2016
Protection of semiconductor-oxide-containing gate dielectric during replacement gate formation
IBM7 citations84
US9349789B1May 24, 2016
Coaxial carbon nanotube capacitor for eDRAM
IBM10 citations84
US9349836B2May 24, 2016
Fin end spacer for preventing merger of raised active regions
IBM6 citations84
US9231072B2Jan 5, 2016
Multi-composition gate dielectric field effect transistors
IBM10 citations84
US9190406B2Nov 17, 2015
Fin field effect transistors having heteroepitaxial channels
IBM7 citations84
US8815693B2Aug 26, 2014
FinFET device formation
IBM13 citations84
US8629510B2Jan 14, 2014
Two-step silicide formation
IBM7 citations84
US10559670B2Feb 11, 2020
Nanosheet field effect transistors with partial inside spacers
IBM2 citations73
US10424515B2Sep 24, 2019
Vertical FET devices with multiple channel lengths
IBM2 citations73
US10418450B2Sep 17, 2019
Self aligned replacement metal source/drain finFET
IBM3 citations73
US10340340B2Jul 2, 2019
Multiple-threshold nanosheet transistors
IBM3 citations73
US10243041B2Mar 26, 2019
Vertical fin field effect transistor with air gap spacers
IBM1 citations73
US10170543B2Jan 1, 2019
Vertical fin field effect transistor with air gap spacers
IBM1 citations73
US10164119B2Dec 25, 2018
Vertical field effect transistors with protective fin liner during bottom spacer recess etch
IBM3 citations73
US9577068B2Feb 21, 2017
Protection of semiconductor-oxide-containing gate dielectric during replacement gate formation
IBM2 citations73
US9059290B2Jun 16, 2015
FinFET device formation
IBM4 citations73
US8647954B2Feb 11, 2014
Two-step silicide formation
IBM4 citations73
US9929058B2Mar 27, 2018
Vertical FETS with variable bottom spacer recess
IBM1 citations63
US9496368B2Nov 15, 2016
Partial spacer for increasing self aligned contact process margins
IBM2 citations63
US8933528B2Jan 13, 2015
Semiconductor fin isolation by a well trapping fin portion
IBM2 citations63
US11024709B2Jun 1, 2021
Vertical fin field effect transistor with air gap spacers
IBM0 citations62
US10957603B2Mar 23, 2021
Vertical FET devices with multiple channel lengths
IBM0 citations62
US10170477B2Jan 1, 2019
Forming MOSFET structures with work function modification
IBM1 citations62
US9331166B2May 3, 2016
Selective dielectric spacer deposition for exposing sidewalls of a finFET
IBM2 citations62
US8704310B2Apr 22, 2014
Trench isolation structure
IBM3 citations62
US10644104B2May 5, 2020
Vertical fin field effect transistor with air gap spacers
IBM0 citations52
US10381463B2Aug 13, 2019
Patterned sidewall smoothing using a pre-smoothed inverted tone pattern
IBM0 citations52
GLOBALFOUNDRIES INC
3 patentsUS9536900B2Jan 3, 2017
Forming fins of different semiconductor materials on the same substrate
GLOBALFOUNDRIES INC7 citations84
US9647124B2May 9, 2017
Semiconductor devices with graphene nanoribbons
GLOBALFOUNDRIES INC2 citations73
US9680019B1Jun 13, 2017
Fin-type field-effect transistors with strained channels
GLOBALFOUNDRIES INC3 citations72
VEGA REINALDO A
2 patentsTESSERA INC
2 patentsTESSERA LLC
1 patentAQUILINO MICHAEL V
1 patentShowing the top 50 of 86 patents by PatentIndex Score.