P

Inventor

VEGA REINALDO A

US86 patents
⚠️ This page may combine multiple inventors who share the name “VEGA REINALDO A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

41 patents
US9530700B1Dec 27, 2016

Method of fabricating vertical field effect transistors with protective fin liner during bottom spacer recess etch

IBM65 citations98
US9437503B1Sep 6, 2016

Vertical FETs with variable bottom spacer recess

IBM73 citations98
US9859421B1Jan 2, 2018

Vertical field effect transistor with subway etch replacement metal gate

IBM25 citations94
US9761727B2Sep 12, 2017

Vertical FETs with variable bottom spacer recess

IBM12 citations92
US9111962B1Aug 18, 2015

Selective dielectric spacer deposition for exposing sidewalls of a finFET

IBM18 citations92
US8643122B2Feb 4, 2014

Silicide contacts having different shapes on regions of a semiconductor device

IBM26 citations92
US10283416B2May 7, 2019

Vertical FETS with variable bottom spacer recess

IBM4 citations84
US10249739B2Apr 2, 2019

Nanosheet MOSFET with partial release and source/drain epitaxy

IBM9 citations84
US10236344B2Mar 19, 2019

Tunnel transistors with abrupt junctions

IBM7 citations84
US10170584B2Jan 1, 2019

Nanosheet field effect transistors with partial inside spacers

IBM11 citations84
US10109535B2Oct 23, 2018

Method of fabricating vertical field effect transistors with protective fin liner during bottom spacer recess ETCH

IBM6 citations84
US9911804B1Mar 6, 2018

Vertical fin field effect transistor with air gap spacers

IBM8 citations84
US9601491B1Mar 21, 2017

Vertical field effect transistors having epitaxial fin channel with spacers below gate structure

IBM10 citations84
US9466693B1Oct 11, 2016

Self aligned replacement metal source/drain finFET

IBM5 citations84
US9431395B2Aug 30, 2016

Protection of semiconductor-oxide-containing gate dielectric during replacement gate formation

IBM7 citations84
US9349789B1May 24, 2016

Coaxial carbon nanotube capacitor for eDRAM

IBM10 citations84
US9349836B2May 24, 2016

Fin end spacer for preventing merger of raised active regions

IBM6 citations84
US9231072B2Jan 5, 2016

Multi-composition gate dielectric field effect transistors

IBM10 citations84
US9190406B2Nov 17, 2015

Fin field effect transistors having heteroepitaxial channels

IBM7 citations84
US8815693B2Aug 26, 2014

FinFET device formation

IBM13 citations84
US8629510B2Jan 14, 2014

Two-step silicide formation

IBM7 citations84
US10559670B2Feb 11, 2020

Nanosheet field effect transistors with partial inside spacers

IBM2 citations73
US10424515B2Sep 24, 2019

Vertical FET devices with multiple channel lengths

IBM2 citations73
US10418450B2Sep 17, 2019

Self aligned replacement metal source/drain finFET

IBM3 citations73
US10340340B2Jul 2, 2019

Multiple-threshold nanosheet transistors

IBM3 citations73
US10243041B2Mar 26, 2019

Vertical fin field effect transistor with air gap spacers

IBM1 citations73
US10170543B2Jan 1, 2019

Vertical fin field effect transistor with air gap spacers

IBM1 citations73
US10164119B2Dec 25, 2018

Vertical field effect transistors with protective fin liner during bottom spacer recess etch

IBM3 citations73
US9577068B2Feb 21, 2017

Protection of semiconductor-oxide-containing gate dielectric during replacement gate formation

IBM2 citations73
US9059290B2Jun 16, 2015

FinFET device formation

IBM4 citations73
US8647954B2Feb 11, 2014

Two-step silicide formation

IBM4 citations73
US9929058B2Mar 27, 2018

Vertical FETS with variable bottom spacer recess

IBM1 citations63
US9496368B2Nov 15, 2016

Partial spacer for increasing self aligned contact process margins

IBM2 citations63
US8933528B2Jan 13, 2015

Semiconductor fin isolation by a well trapping fin portion

IBM2 citations63
US11024709B2Jun 1, 2021

Vertical fin field effect transistor with air gap spacers

IBM0 citations62
US10957603B2Mar 23, 2021

Vertical FET devices with multiple channel lengths

IBM0 citations62
US10170477B2Jan 1, 2019

Forming MOSFET structures with work function modification

IBM1 citations62
US9331166B2May 3, 2016

Selective dielectric spacer deposition for exposing sidewalls of a finFET

IBM2 citations62
US8704310B2Apr 22, 2014

Trench isolation structure

IBM3 citations62
US10644104B2May 5, 2020

Vertical fin field effect transistor with air gap spacers

IBM0 citations52
US10381463B2Aug 13, 2019

Patterned sidewall smoothing using a pre-smoothed inverted tone pattern

IBM0 citations52

GLOBALFOUNDRIES INC

3 patents

VEGA REINALDO A

2 patents

TESSERA INC

2 patents

TESSERA LLC

1 patent

AQUILINO MICHAEL V

1 patent

Showing the top 50 of 86 patents by PatentIndex Score.