Inventor
SHIN KYEONG-SEON
KR14 patents
Patents
14 patentsUS6903567B2Jun 7, 2005
Test apparatus having multiple test sites at one handler and its test method
SAMSUNG ELECTRONICS CO LTD17 citations91
US6960908B2Nov 1, 2005
Method for electrical testing of semiconductor package that detects socket defects in real time
SAMSUNG ELECTRONICS CO LTD14 citations82
US7633288B2Dec 15, 2009
Method of testing semiconductor devices and handler used for testing semiconductor devices
SAMSUNG ELECTRONICS CO LTD7 citations72
US6861682B2Mar 1, 2005
Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same
SAMSUNG ELECTRONICS CO LTD7 citations72
US6850450B2Feb 1, 2005
Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell
SAMSUNG ELECTRONICS CO LTD10 citations72
US6972612B2Dec 6, 2005
Semiconductor device with malfunction control circuit and controlling method thereof
SAMSUNG ELECTRONICS CO LTD2 citations62
US7602172B2Oct 13, 2009
Test apparatus having multiple head boards at one handler and its test method
SAMSUNG ELECTRONICS CO LTD1 citations61
US7378864B2May 27, 2008
Test apparatus having multiple test sites at one handler and its test method
SAMSUNG ELECTRONICS CO LTD4 citations61
US7671361B2Mar 2, 2010
Semiconductor device including fuse focus detector, fabricating method thereof and laser repair method using the fuse focus detector
SAMSUNG ELECTRONICS CO LTD3 citations60
US7230417B2Jun 12, 2007
Test system of semiconductor device having a handler remote control and method of operating the same
SAMSUNG ELECTRONICS CO LTD5 citations60
US7492032B2Feb 17, 2009
Fuse regions of a semiconductor memory device and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD4 citations56
US7689876B2Mar 30, 2010
Real-time optimized testing of semiconductor device
SAMSUNG ELECTRONICS CO LTD6 citations55
US7408339B2Aug 5, 2008
Test system of semiconductor device having a handler remote control and method of operating the same
SAMSUNG ELECTRONICS CO LTD1 citations50
US6922050B2Jul 26, 2005
Method for testing a remnant batch of semiconductor devices
SAMSUNG ELECTRONICS CO LTD1 citations50