Inventor
BUDRI THANAS
US9 patents
⚠️ This page may combine multiple inventors who share the name “BUDRI THANAS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NAT SEMICONDUCTOR CORP
5 patentsUS7892915B1Feb 22, 2011
High performance SiGe:C HBT with phosphorous atomic layer doping
NAT SEMICONDUCTOR CORP5 citations71
US7319530B1Jan 15, 2008
System and method for measuring germanium concentration for manufacturing control of BiCMOS films
NAT SEMICONDUCTOR CORP5 citations69
US7508531B1Mar 24, 2009
System and method for measuring germanium concentration for manufacturing control of BiCMOS films
NAT SEMICONDUCTOR CORP3 citations58
US7038222B1May 2, 2006
System and method for using areas near photo global alignment marks or unpatterned areas of a semiconductor wafer to create structures for SIMS or E-Beam or XRD testing
NAT SEMICONDUCTOR CORP5 citations53
US7781289B1Aug 24, 2010
Method for fabricating higher quality thicker gate oxide in a non-volatile memory cell and associated circuits
NAT SEMICONDUCTOR CORP0 citations50
BUDRI THANAS
3 patentsUS8481142B1Jul 9, 2013
System and method for monitoring chloride content and concentration induced by a metal etch process
BUDRI THANAS3 citations57
US8097923B2Jan 17, 2012
Method for fabricating higher quality thicker gate oxide in a non-volatile memory cell and associated circuits
BUDRI THANAS0 citations48
US8679936B1Mar 25, 2014
Manufacturing resistors with tightened resistivity distribution in semiconductor integrated circuits
BUDRI THANAS0 citations24