Inventor
GHAMMRAOUI BAHAA
LB2 patents
Patents
2 patentsUS9599580B2Mar 21, 2017
Diffractometry-based analysis method and associated diffractometer, particularly suitable for samples comprising multiple layers of materials
COMMISSARIAT ENERGIE ATOMIQUE5 citations68
US9285329B2Mar 15, 2016
Method of analysing a sample of material by diffractometry and associated diffractometer
COMMISSARIAT ENERGIE ATOMIQUE5 citations68