Inventor
WU AIHUA
CN7 patents
⚠️ This page may combine multiple inventors who share the name “WU AIHUA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION
6 patentsUS11971451B2Apr 30, 2024
Method for determining parameters in on-wafer calibration piece model
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION0 citations47
US11733298B2Aug 22, 2023
Two-port on-wafer calibration piece circuit model and method for determining parameters
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION0 citations47
US11385175B2Jul 12, 2022
Calibration method and terminal equipment of terahertz frequency band on-wafer S parameter
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION0 citations47
US11340286B2May 24, 2022
On-wafer S-parameter calibration method
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION0 citations45
US12025501B2Jul 2, 2024
Three-dimensional displacement compensation method for microscopic thermoreflectance thermography and control device
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION0 citations43
US11275103B2Mar 15, 2022
Calibration method, system and device of on-wafer s parameter of vector network analyzer
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION0 citations43